Zeitschriftenartikel
Worch, L.; Mulcahy, N.; Jannat, R.; Douglas, J.; Arunasalam, K.; Gault, B.; Nicolosi, V.; Conroy, M.: Cold to Go: Cryogenic Atom Probe Tomography to Investigate the Nanoscale Solid-Liquid Interfaces of SnSe Anodes for Next-Generation Batteries. Microscopy and Microanalysis
31 (7), S. 664 - 666 (2025)