Vortrag
Joo, M.; Xiu, H.; Cheng, N.; Somsen, C.; Baha, S.; Ludwig, A.; Li, Y.; Kostka, A.; Scheu, C.: Investigation of planar defect evolution in Au–Pd–Pt–Ru-based compositionally complex solid solution thin films using analytical transmission electron microscopy. The 2025 Fall Meeting of the European Materials Research Society (E-MRS), Warsaw, Poland (2025)