Konferenzbeitrag
Balk, T. J.; Dehm, G.; Arzt, E.: A New Type of Dislocation Mechanism in Ultrathin Copper Films. In: Materials Research Society Symposium - Proceedings, Bd.
695, S. 53 - 58. Materials Research Society Symposium L - Thin Films: Stresses and Mechanical Properties IX, Boston, MA, USA, 26. November 2001 - 30. November 2001. (2002)