Konferenzbeitrag
Dehm, G.; Legros, M.; Heiland, B.: In-situ TEM straining experiments of Al films on polyimide using a novel FIB design for specimen preparation. 10th Meeting on Frontiers of Electron Microscopy in Materials Science, Maastricht, The Netherlands, 25. September 2005 - 30. September 2005. Journal of Materials Science
41 (14), S. 4484 - 4489 (2006)