Zeitschriftenartikel
            Yang, B.; Motz, C.; Rester, M.; Dehm, G.:  Yield stress influenced by the ratio of wire diameter to grain size – a competition between the effects of specimen microstructure and dimension in micro-sized polycrystalline copper wires. Philosophical Magazine Letters; Nano-mechanical testing in materials research and development III 
92 (25-27), S. 3243 - 3256 (2012)