Publikationen von Chanwon Jung

Vortrag (24)

41.
Vortrag
Jung, C.: Understanding of the property-structure relationship for thermoelectric materials through advanced characterization. Korea Electrotechnology Research Institute, Changwon, South Korea (2023)
42.
Vortrag
Jung, C.: Investigation of interface between CIGS and buffer layer using atom probe tomography. Korea Institute of Energy Research, Daejeon, South Korea (2023)
43.
Vortrag
Jung, C.: NbCoSn based half-Heusler compounds through crystallization of amorphous precursors. Kyungpook National University, Daegu, South Korea (2023)
44.
Vortrag
Jung, C.: Atom probe tomography for nanostructured functional materials. Korea Institute of Energy Research, Daejeon, South Korea (2023)
45.
Vortrag
Jung, C.: Sample preparation of nanomaterials for atom probe tomography. Hanbat National University, Daejeon, South Korea (2023)
46.
Vortrag
Jung, C.: Advanced characterization for functional nanomaterials. Korea University, Seoul, South Korea (2023)
47.
Vortrag
Jung, C.: Sample preparation of nanomaterials for atom probe analysis. NRF-DFG meeting “Electrodes for direct sea-water splitting and microstructure based stability analyses”, Korean Institute for Energy Research, Jeju, South Korea (2023)
48.
Vortrag
Jung, C.: NbCoSn half-Heusler compounds through crystallization of amorphous precursors. Korea Institute of Ceramic Engineering and Technology, Jinju, South Korea (2023)
49.
Vortrag
Jung, C.; Jang, K.; Zhang, S.; Bueno Villoro, R.; Choi, P.-P.; Scheu, C.: Sb-doping induced order to disorder transition enhances the thermal stability of NbCoSn1-xSbx half-Heusler semiconductors. The 20th International Microscopy Congress, PS-07.2. Microscopy of Semiconductor Materials and Devices, Busan, Republic of Korea (2023)
50.
Vortrag
Zhang, S.; Yu, Y.; Jung, C.; Abdellaoui, L.; Scheu, C.: In situ TEM unveils dynamic doping behavior of thermoelectric materials – Microstructure and property evolution under heating and electric biasing. International Microscopy Conference IMC20, Busan, Korea (2023)
51.
Vortrag
Jung, C.: Advanced characterization for functional materials. Korea Institute of Materials Science, Changwon, South Korea (2023)
52.
Vortrag
Jung, C.: Understanding of functional materials through atom probe analysis. The 20th International Microscopy Congress, Workshop session for cryo atom probe tomography, Busan, Republic of Korea (2023)
53.
Vortrag
Jung, C.: Atom probe tomography for nanoscale characterization of functional materials. Global Photovoltaic Conference 2023, Session: CiS. II-VI & Chalcogenide compound-based cells and materials, Satellite-CiS-2, Gwangju, Repuplic of Korea (2023)
54.
Vortrag
Jung, C.: Nanostructuring of NbCoSn-based half-Heusler thermoelectric materials through the crystallization of an amorphous precursor. Colloquium, Leibniz-Institut für Festkörper- und Werkstoffforschung, Dresden, Germany (2022)
55.
Vortrag
Zhang, S.; Abdellaoui, L.; Bueno Villoro, R.; Jung, C.; Mattlat, D. A.; Scheu, C.: In situ microstructural observation of PbTe thermoelectrics by TEM. Colloquium, Leibniz-Institut für Festkörper- und Werkstoffforschung , Dresden, Germany (2022)
56.
Vortrag
Scheu, C.; Abdellaoui, L.; Bueno Villoro, R.; Cojocaru-Mirédin, O.; Gault, B.; Luo, T.; Jung, C.; Yu, Y.; Zaefferer, S.; Zhang, S.: A scale bridging approach for analysis of extended defects in thermoelectric materials: From electron channeling contrast imaging, scanning transmission electron microscopy to atom probe tomography. ELMINA2022, Belgrade, Serbia (2022)

Poster (5)

57.
Poster
Mattlat, D. A.; Jung, C.; Ying, P.; Li, J.; He, S.; Bahrami, A.; Zhang, S.; Scheu, C.: New method of FIB TEM sample preparation for in situ heating and biasing MEMS chip used for investigation on Zn4Sb3 thermoelectric material. Microscopy Conference (MC) 2025, Karlsruhe, Germany (2025)
58.
Poster
Mattlat, D. A.; Bueno Villoro, R.; Jung, C.; Naderloo, R. H.; He, R.; Nielsch, K.; Zavanelli, D.; Snyder, G. J.; Zhang, S.; Scheu, C.: Electron microscopy characterization of grain boundaries in Nb1-xTixFeSb based half-Heusler thermoelectric materials. Electron Microscopy Congress (EMC) 2024, Copenhagen, Denmark (2024)
59.
Poster
Mattlat, D. A.; Bueno Villoro, R.; Jung, C.; Scheu, C.; Zhang, S.; Naderloo, R. H.; Nielsch, K.; He, .; Zavanelli, D.; Snyder, G. J.: Effective doping of InSbat the grain boundaries in Nb1-xTixFeSb based Half-Heusler thermoelectricsfor high electrical conductivity and Seebeckcoefficient. 40th International & 20th European Conference on Thermoelectrics, Krakow, Poland (angenommen)
60.
Poster
Schwarz, T.; Woods, E.; Singh, M. P.; Jung, C.; Aota, L. S.; Jang, K.; Krämer, M.; Kim, S.-H.; McCaroll, I.; Gault, B.: In-situ metallic coating of atom probe specimen for enhanced yield, performance, and increased field-of-view. APT&M 23, Leuven, Belgium (2023)

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