Konferenzbeitrag
Dehm, G.; Arzt, E.: In-situ TEM study of thermal-stress induced dislocations in a Cu thin film on a SiN
x coated Si-substrate. In: Proceedings of the 12th European Congress on Electron Microscopy, Bd.
2 (Hg. Luděk , .). 12th European Congress on Electron Microscopy (EUREM2000), Brno, Czech Republic, 09. Juli 2000 - 14. Juli 2000. Czechoslovak Society for Electron Microscopy, Brno (2000)