Publikationen von Guillaume Stechmann

Schwarz, T.; Stechmann, G.; Gault, B.; Cojocaru-Mirédin, O.; Würz, R.; Raabe, D.: Correlative transmission Kikuchi diffraction and atom probe tomography study of Cu(In,Ga)Se₂ grain boundaries. Progress in Photovoltaics: Research and Applications 26 (3), S. 196 - 204 (2018)

Stechmann, G.; Zaefferer, S.; Raabe, D.: Molecular statics simulation of CdTe grain boundary structures and energetics using a bond-order potential. Modelling and Simulation in Materials Science and Engineering 26 (4), 045009 (2018)

Stechmann, G.; Zaefferer, S.; Schwarz, T.; Konijnenberg, P. J.; Raabe, D.; Gretener, C.; Kranz, L.; Perrenoud, J.; Bücheler, S.; Tiwari, A. N.: A correlative investigation of grain boundary crystallography and electronic properties in CdTe thin film solar cells. Solar Energy Materials and Solar Cells 166, S. 108 - 120 (2017)

Stechmann, G.; Zaefferer, S.; Konijnenberg, P. J.; Raabe, D.; Gretener, C.; Kranz, L.; Perrenoud, J.; Bücheler, S.; Tiwari, A. N.: 3-Dimensional microstructural characterization of CdTe absorber layers from CdTe/CdS thin film solar cells. Solar Energy Materials and Solar Cells 151, S. 66 - 80 (2016)

Zaefferer, S.; Stechmann, G.: Electron backscatter diffraction (EBSD) and electron channelling contrast imaging (ECCI) for the study of thin film solar cells. In: Tagungsband des EFDS Workshops “Morphologie und Mikrostruktur Dünner Schichten und deren Beeinflussung” (Hg. Wetzig, K.). EFDS Workshop “Morphologie und Mikrostruktur Dünner Schichten und deren Beeinflussung”, Dresden, Germany, 12. März 2015. (2015)

Schwarz, T.; Stechmann, G.; Gault, B.; Cojocaru-Mirédin, O.; Würz, R.; Lomuscio, A.; Siebentritt, S.; Raabe, D.: Correlative transmission Kikuchi diffraction and atom probe tomography analysis of grain boundaries in Cu(In,Ga) Se₂ and CuInS₂. E-MRS Spring Meeting 2018, Strasbourg, France (2018)

Schwarz, T.; Stechmann, G.; Gault, B.; Cojocaru-Mirédin, O.; Würz, R.; Lomuscio, A.; Siebentritt, S.; Raabe, D.: Correlative transmission Kikuchi diffraction and atom probe tomography analysis of grain boundaries in Cu(In,Ga) Se₂ and CuInS₂ in thin film solar cells. APT&M 2018, NIST, Gaithersburg, MD, USA (2018)

Zaefferer, S.; Schemmann, L.; Stechmann, G.; Ram, F.; Archie, F. M. F.: Using orientation microscopy to explore the correlation of materials properties and microstructures. 25th International conference on materials and technology, Portorož, Slovenia (2017)

Konijnenberg, P. J.; Stechmann, G.; An, D.; Nayyeri, G.; Sinclair, C. W.; Poole, W. J.; Zaefferer, S.; Raabe, D.: Recent Developments in the Analysis of Microstructures by 3D-EBSD. 12th European Congress for Stereology and Image Analysis, Kaiserslautern, Germany (2017)

Schwarz, T.; Stechmann, G.; Gault, B.; Cojocaru-Mirédin, O.; Choi, P.-P.; Redinger, A.; Siebentritt, S.; Raabe, D.: Correlative transmission EBSD-APT analysis of grain boundaries in CIGS and CZTS based thin-film solar cells. Euromat, Thessaloniki, Greece (2017)

Konijnenberg, P. J.; An, D.; Stechmann, G.; Zaefferer, S.; Raabe, D.: Recent Developments in the Analysis of Microstructures by 3D-EBSD. Symposium: 3D materials characterization at all length scales and its applications to iron and steel, Düsseldorf, Germany (2017)

Schwarz, T.; Stechmann, G.; Gault, B.; Cojocaru-Mirédin, O.; Choi, P.-P.; Redinger, A.; Siebentritt, S.; Raabe, D.: Correlative transmission EBSD-APT analysis of grain boundaries in Cu(In,Ga)Se₂ and Cu₂ZnSnSe₄ based thin-film solar cells. Microscopy & Microanalysis, St. Louis, Missouri, USA (2017)

Stechmann, G.; Zaefferer, S.; Konijnenberg, P. J.; Schwarz, T.; Raabe, D.; Gretener, C.; Kranz, L.; Perrenoud, J.; Bücheler, S.; Tiwari, A. N.: Structure and Properties of Grain Boundaries in CdTe Solar Cells. E-MRS 2016 SPRING MEETING, Lille, France (2016)

Stechmann, G.; Zaefferer, S.: 3-dimensionnal Microstructural Characterization of CdTe-based Solar Cells. Zentrum für Sonnenenergie- und Wasserstoff-Forschung Baden-Württemberg, Stuttgart, Germany (2015)

Zaefferer, S.; Stechmann, G.: Electron backscatter diffraction (EBSD) and electron channelling contrast imaging (ECCI) for the study of thin film solar cells. Workshop Morphologie und Mikrostruktur dünner Schichten, Dresden, Germany (2015)

Stechmann, G.; Zaefferer, S.; Konijnenberg, P. J.; Raabe, D.; Gretener, C.; Kranz, L.; Perrenoud, J.; Bücheler, S.; Tiwari, A. N.: 3-Dimensional Microstructural and Crystallographic Characterization of CdTe Absorber Layers from CdTe/CdS Solar Cells Grown in Substrate Configuration. E-MRS, European Materials Research Society Conference 2014 , Lille, France (2014)

Konijnenberg, P. J.; Stechmann, G.; Zaefferer, S.; Raabe, D.: Advances in Analysis of 3D Orientation Data Sets Obtained by FIB-EBSD Tomography. 2nd International Congress on 3D Materials Science 2014, Annecy, France (2014)

Konijnenberg, P. J.; Khorashadizadeh, A.; Stechmann, G.; Zaefferer, S.; Raabe, D.: Challenges and Opportunities in the Analysis of 3D-EBSD datasets. European Congress for Stereology 2013, Kaiserslautern, Germany (2013)

Konijnenberg, P. J.; Khorashadizadeh, A.; Stechmann, G.; Zaefferer, S.; Raabe, D.: Challenges and Opportunities in the Analysis of 3D-EBSD datasets. Scandem 2013, Copenhagen, Demark (2013)

Konijnenberg, P. J.; Stechmann, G.; Zaefferer, S.: Comprehensive, 5-parameter crystallographic grain boundary characterization and its application to thin-film CdTe solar cells. IDSC 2013, Düsseldorf, Germany (2013)