Zaefferer, S.; Kleindiek, S.; Schock, K.; Volbert, B.: Combined Application of EBSD and ECCI Using a Versatile 5-Axes Goniometer in an SEM. Microscopy and Microanalysis 2013, Indianapolis, IN, USA (2013)
Zaefferer, S.; Elhami, N. N.; Konijnenberg, P. J.; Jäpel, T.: Quantitative Microstructure Characterization by Application of Advanced SEM-Based Electron Diffraction Techniques. Microscopy and Microanalysis 2013, Indianapolis, IN, USA (2013)
Raabe, D.; Choi, P.; Herbig, M.; Li, Y.; Zaefferer, S.; Kirchheim, R.: Iron – Mythology and High Tech: From Electronic Understanding to Bulk Nanostructuring of 1 Billion Tons. Summer School 2013 on Functional Solids – FERRUM - organized by Leibniz University Hannover, Goslar, Germany (2013)
Zaefferer, S.: An overview on techniques for high spatial resolution measurements of plastic and elastic strain by EBSD and related techniques. RexGG pre-conference workshop, Wollongong, Australia (2013)
Zaefferer, S.; Konijnenberg, P. J.: Advanced analysis of 3D EBSD data obtained from FIB-EBSD tomography. RexGG pre-conference workshop, Wollongong, Australia (2013)
Zaefferer, S.: An overview on techniques for high spatial resolution measurements of plastic and elastic strain by EBSD and related techniques. MicroCar 2013, Leipzig, Germany (2013)