Gault, B.: An introduction to atom probe tomography: from fundamentals to atomic-scale insights into engineering materials. Rolls Royce Lunch Time Seminar, Derby, UK (2020)
Kwiatkowski da Silva, A.; Ponge, D.; Gault, B.; Raabe, D.: The Relevance of Interfacial Segregation for Controlling Second Phase Precipitation in Advanced High Strength Steels. TMS 2020 Annual Meeting & Exhibition, San Diego, CA, USA (2020)
Gault, B.: Can machine learning bring atom probe microscopy closer to analytical atomic-scale tomography. 12th International Symposium on Atomic Level Characterizations for New Materials and Devices (ALC 19), Kyoto, Japan (2019)