Konferenzbeitrag
Parviainen, S.; Dagan, M.; Katnagallu, S.; Gault, B.; Moody, M. P.; Vurpillot, F.: Atomistic Simulations of Surface Effects Under High Electric Fields. In: Proceedings of Microscopy & Microanalysis 2017, Bd.
23, S. 644 - 645. Microscopy & Microanalysis 2017, St. Louis, Missouri, USA, 06. August 2017 - 10. August 2017. (2017)