Konferenzbeitrag
Elhami, N.; Tasan, C. C.; Zaefferer, S.: Quantitative defect analysis using electron channeling contrast imaging under controlled diffraction conditions (cECCI). In: Proceedings of M&M 2012, S. 690 - 691 (Hg. Shields, J.; McKernan, S.; Brewer, L.; Ruiz, T.; Turnquist, D.). Microscopy & Microanalysis 2012, Phoenix, AZ, USA, 29. Juli 2012 - 02. August 2012. Microscopy Society of America (2012)