Herbig, M.; Raabe, D.; Li, Y.; Choi, P.; Zaefferer, S.; Goto, S.: High Throughput Quantification of Grain Boundary Segregation by Correlative TEM and APT. TMS 2014, Solid-State Interfaces III Symposium, San Diego, CA, USA (2014)
Herbig, M.; Raabe, D.; Li, Y.; Choi, P.-P.; Zaefferer, S.; Goto, S.: High Throughput Quantification of Grain Boundary Segregation by Correlative Transmission Electron Microscopy and Atom Probe Tomography. International Conference on Atom Probe Tomography & Microscopy 2014, Stuttgart, Germany (2014)
Konijnenberg, P. J.; Stechmann, G.; Zaefferer, S.; Raabe, D.: Advances in Analysis of 3D Orientation Data Sets Obtained by FIB-EBSD Tomography. 2nd International Congress on 3D Materials Science 2014, Annecy, France (2014)
Ram, F.; Khorashadizadeh, A.; Zaefferer, S.: Kikuchi Band Sharpness: A Measure for the Density of the Crystal Lattice Defects. MSE 2014, Darmstadt, Germany (2014)
Ram, F.; Zaefferer, S.: Accurate Kikuchi band localization and its application for diffraction geometry determination. HR-EBSD workshop, Imperial College, London, UK (2014)
Ram, F.; Zaefferer, S.: Plastic strain derivation and Kikuchi band localization by applying the Kikuchi bandlet method to electron backscatter Kikuchi Diffraction patterns. 17th ICOTOM, Dresden; Germany (2014)
Zaefferer, S.: SEM and TEM based orientation microscopy for investigation of recrystallization processes. CNRS summer school on recrystallization, Frejus, France (2014)
Herbig, M.; Raabe, D.; Li, Y. J.; Choi, P.; Zaefferer, S.; Goto, S.: Quantification of Grain Boundary Segregation in Nanocrystalline Material. Seminar at Department Microstructure Physics and Alloy Design, MPI für Eisenforschung, Düsseldorf, Germany (2013)
Zaefferer, S.; Elhami, N. N.: Electron Channelling Contrast Imaging under controlled diffraction conditions, cECCI - Theory and Applications. CEMEF, Sofia-Antipolis, France (2013)
Zaefferer, S.; Kleindiek, S.; Schock, K.; Volbert, B.: Combined Application of EBSD and ECCI Using a Versatile 5-Axes Goniometer in an SEM. Microscopy and Microanalysis 2013, Indianapolis, IN, USA (2013)
Zaefferer, S.; Elhami, N. N.; Konijnenberg, P. J.; Jäpel, T.: Quantitative Microstructure Characterization by Application of Advanced SEM-Based Electron Diffraction Techniques. Microscopy and Microanalysis 2013, Indianapolis, IN, USA (2013)
Max-Planck-Team erklärt Rissbildung während des Ladevorgangs und ebnet so den Weg zu sichereren und langlebigeren Batterien. Das Team veröffentlicht seine Ergebnisse im Wissenschaftsjournal Nature.
Wissenschaftler des Max-Planck-Instituts für Eisenforschung entwickeln ein neues maschinelles Lernmodell für korrosionsresistente Legierungen. Und veröffentlichen ihre Ergebnisse in der Fachzeitschrift Science Advances
Düsseldorfer Max-Planck-Wissenschaftler diskutieren den Einsatz künstlicher Intelligenz in der Materialwissenschaft und veröffentlichen Review-Artikel in der Fachzeitschrift Nature Computational Science