Publikationen von Gerhard Dehm

Bidlingmaier, T.; Wanner, A.; Dehm, G.; Clemens, H.: Acoustic Emission during Room Temperature Deformation of a γ-TiAl Based Alloy. Zeitschrift für Metallkunde 90, S. 581 - 587 (1999)

Scheu, C.; Dehm, G.; Rühle, M.; Brydson, R.: Electron-energy-loss spectroscopy studies of Cu-α-Al₂O₃ interfaces grown by molecular beam epitaxy. Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties 78 (2), S. 439 - 465 (1998)

Dehm, G.; Thomas, J.; Mayer, J.; Weißgärber, T.; Püsche, W.; Sauer, C.: Formation and Interface Structure of TiC Particles in Dispersion Strengthened Cu Alloys. Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties 77 (6), S. 1531 - 1554 (1998)

Sauer, C.; Weißgärber, T.; Dehm, G.; Mayer, J.; Püsche, W.; Kieback, B. F.: Dispersion Strengthening of Copper Alloys. Zeitschrift für Metallkunde 89 (2), S. 119 - 125 (1998)

Dehm, G.; Scheu, C.; Rühle, M.; Raj, R.: Growth and Structure of Internal Cu/Al₂O₃ and Cu/Ti/Al₂O3 Interfaces. Acta Materialia 46 (3), S. 759 - 772 (1998)

Scheu, C.; Dehm, G.; Kaplan, W. D.; Wagner, F.; Claussen, N. E.: Microstructure and Phase Evolution of Niobium-Aluminide-Alumina Composites Prepared by Melt-Infiltration. Physica Status Solidi A 166 (1), S. 241 - 255 (1998)

Gaudette, F. G.; Süresh, S.; Evans, A. G.; Dehm, G.; Rühle, M.: The Influence of Chromium Addition on the Toughness of γ-Ni/α-Al₂O₃ Interfaces. Acta Materialia 45 (9), S. 3503 - 3513 (1997)

Dehm, G.; Scheu, C.; Möbus, G.; Brydson, R.; Rühle, M.: Synthesis of Analytical and High Resolution Transmission Electron Microscopy to Determine the Interface Structure of Cu/Al₂O₃. Ultramicroscopy 67 (1-4), S. 207 - 217 (1997)

Dehm, G.; Rühle, M.; Conway, H. D.; Raj, R.: A microindentation method for estimating interfacial shear strength and its use in studying the influence of titanium transition layers on the interface strength of epitaxial copper films on sapphire. Acta Materialia 45 (2), S. 489 - 499 (1997)

Sauer, C.; Weißgärber, T.; Püsche, W.; Dehm, G.; Mayer, J.; Kieback, B. F.: High Temperature Creep of Microcrystalline Dispersion Strengthened Copper Alloys. International Journal of Powder Metallurgy 33 (1), S. 45 - 53 (1997)

Dehm, G.; Ernst, F.; Mayer, J.; Möbus, G.; Müllejans, H.; Phillipp, F.; Scheu, C.; Rühle, M.: Transmission Electron Microscopy at the Max-Planck-Institut für Metallforschung. Zeitschrift für Metallkunde 87 (11), S. 898 - 910 (1996)

Möbus, G.; Dehm, G.: Retrieval of Crystal Defect Structures from HREM Images by Simulated Evolution. II. Experimental Image Evaluation. Ultramicroscopy 65 (3-4), S. 217 - 228 (1996)

Dehm, G.; Nadarzinski, K.; Ernst, F.; Rühle, M.: Quantification of Irradiation Damage Generated During HRTEM with 1250keV Electrons. Ultramicroscopy 63 (1), S. 49 - 55 (1996)

Dehm, G.; Scheu, C.; Raj, R.; Rühle, M.: Growth, structure and interfaces of Cu and Cu/Ti thin films on (0001)alpha-Al₂O₃. Materials Science Forum 207-209 (1), S. 217 - 220 (1996)

Dehm, G.; Raj, R.; Rühle, M.: Influence of Interfacial Layers on the Ultimate Shear Strength of Copper/Sapphire Interfaces. Materials Science Forum 207-209 (2), S. 597 - 600 (1996)

Scheu, C.; Dehm, G.; Müllejans, H.; Rühle, M.: Electron Energy-Loss Spectroscopy at Cu/Al₂O₃ and Ti/Al₂O₃ Interfaces. Materials Science Forum 207-209 (1), S. 181 - 184 (1996)

Möbus, G.; Schumann, E.; Dehm, G.; Rühle, M.: Measurement of Coherency States of Metal-Ceramic Interfaces by HRTEM Image Processing. Physica Status Solidi A 150 (1), S. 77 - 87 (1995)

Dehm, G.; Rühle, M.; Ding, G.; Raj, R.: Growth and Structure of Copper Thin Films Deposited on (0001) Sapphire by Molecular Beam Epitaxy. Philosophical Magazine B-Physics of Condensed Matter Statistical Mechanics Electronic Optical and Magnetic Properties 71 (6), S. 1111 - 1124 (1995)

Scheu, C.; Dehm, G.; Müllejans, H.; Brydson, R.; Rühle, M.: Electron Energy-Loss Near-Edge Structure of Metal-Alumina Interfaces. Microscopy Microanalysis Microstructures 6 (1), S. 19 - 31 (1995)

Dehm, G.; Zweck, J.: In-situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science. Wiley VCH Verlag, Weinheim, Germany (2012)