Suchergebnisse

Buchkapitel (7)

281.
Buchkapitel
Motz, C.; Kiener, D.; Schöberl, T.; Pippan, R.; Dehm, G.: Sekundärionen-Massenspektroskopie (SIMS) mittels FIB. In: Handbuch der Nanoanalytik Steiermark, NanoNet Styria, 1 Aufl., S. 1 - 311 (Hg. Rom, W.). W. Rom, Graz, Austria (2005)
282.
Buchkapitel
Motz, C.; Kiener, D.; Schöberl, T.; Pippan, R.; Dehm, G.: Fokussierte Ionenstrahl-Technik (FIB) in der Mikro- und Nanomechanik. In: Handbuch der Nanoanalytik Steiermark, NanoNet Styria, 1 Aufl., S. 1 - 311 (Hg. Rom, W.). W. Rom, Graz, Austria (2005)
283.
Buchkapitel
Pippan, R.; Vorhauer, A.; Wetscher, F.; Dehm, G.: Nanokristallisierung durch Hochverformung. In: Handbuch der Nanoanalytik Steiermark, NanoNet Styria, 1 Aufl., S. 1 - 311 (Hg. Rom, W.). W. Rom, Graz, Austria (2005)
284.
Buchkapitel
Dehm, G.; Müllner, P.: TEM-Observation of Dislocations in Polycrystalline Metal Films. In: The Encyclopedia of Materials: Science and Technology, Bd. 1, S. 2329 - 2331 (Hg. Buschow, .H.J.; Cahn, R.; Flemings, M.; Ilschner, .; Kramer, E. et al.) (2001)

Konferenzband (1)

285.
Konferenzband
Microstructure of Ni2B Laser-Induced Surface-Alloyed α-Fe (Materials Resaerch Symposium Proceedings, Phase Transformations and Systems Driven far from Equilibrium, 481). MRS Fall Meeting´97, Boston, MA, USA. (2001)

Konferenzbeitrag (68)

286.
Konferenzbeitrag
Luo, W.; Kirchlechner, C.; Dehm, G.; Stein, F.: Micromechanics of Co–Nb Laves Phases: Strength, Fracture Toughness, and Hadrness as Function of Composition and Crystal Structure. In: Joint EPRI – 123HIMAT International Conference on Advances in High-Temperature Materials, 2019, S. 11 - 21 (Hg. Shingledecker, J.; Takeyama, M.). EPRI's 9th International Conf on Advances in Materials Technology for Fossil Power Plants and the 2nd International 123HiMAT Conf on High-Temperature Materials, Nagasaki, Japan, 21. Oktober 2019 - 24. Oktober 2019. (2019)
287.
Konferenzbeitrag
Luo, W.; Kirchlechner, C.; Dehm, G.; Stein, F.: Deformation of Micropillars of Cubic and Hexagonal NbCo2 Laves Phases under Uniaxial Compression at Room Temperature. In: Proc. Intermetallics 2017, S. 199 - 200 (Hg. Heilmaier, M.; Krüger, M.; Mayer, S.; Palm, M.; Stein, F.). Intermetallics 2017, Educational Center Kloster Banz, Bad Staffelstein, Germany, 02. Oktober 2017 - 06. Oktober 2017. Conventus Congressmanagement & Marketing GmbH, Jena, Germany (2017)
288.
Konferenzbeitrag
Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Dehm, G.; Scheu, C.: In situ electron microscopy – insights in solid state dewetting of epitaxial Al thin films on sapphire. In: Microscopy Conference 2017 (MC 2017) - Proceedings (Hg. Laue, M.). Microscopy Conference 2017 (MC 2017), Lausanne, Switzerland, 21. August 2017 - 25. August 2017. Universität Regensburg, Regensburg (2017)
289.
Konferenzbeitrag
Taniguchi, S.; Soler, R.; Kirchlechner, C.; Liebscher, C.; Taniyama, A.; Dehm, G.: In-situ TEM Study of Mechanical Size Effects in TiC Strengthened Steels. Microscopy & Microanalysis 2017, St. Louis, MO, USA, 06. August 2017 - 10. August 2017. Proceedings of Microscopy & Microanalysis 2017 23 (S1), S. 732 - 733 (2017)
290.
Konferenzbeitrag
Hieke, S. W.; Dehm, G.; Scheu, C.: Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy. In: European Microscopy Congress 2016: Proceedings, S. 203 - 204. The 16th European Microscopy Congress (EMC 2016), Lyon, France, 28. August 2016 - 02. September 2016. Wiley-VCH Verlag GmbH & Co KGaA (2016)
291.
Konferenzbeitrag
Liebscher, C.; Stoffers, A.; Cojocaru-Mirédin, O.; Gault, B.; Scheu, C.; Dehm, G.; Raabe, D.: Topological Impurity Segregation at Faceted Silicon Grain Boundaries Studied by Correlative Atomic-Resolution STEM and APT. In: Microscopy and Microanalysis, Bd. 22, S. 46 - 47. 3rd Conference on In Situ and Correlative Electron Microscopy (CISCEM 2016) , Saarbrücken, Germany, 11. Oktober 2016 - 12. Oktober 2016. (2016)
292.
Konferenzbeitrag
Heinz, W.; Dehm, G.: Grain resolved orientation changes and texture evolution in a thermally strained Al film on Si substrate. The 38th International Conference on Metallurgical Coatings and Thin Films (ICMCTF 2011), San Diego, CA, USA, 02. Mai 2011 - 06. Mai 2011. Surface and Coatings Technology, Part of special issue: Proceedings of the 38th International Conference on Metallurgical Coatings and Thin Films (ICMCTF), ICMCTF 2011 206 (7), S. 1511 - 2034 (2011)
293.
Konferenzbeitrag
Motz, C.; Kiener, D.; Kirchlechner, C.; Grosinger, W.; Pippan, R.; Dehm, G.: Advances in in-situ testing in scanning electron microscopes: probing mechanical properties at the nano/micro-scale. In: 10th Multinational Congress on Microscopy (MCM 2011), S. 57 - 58. 10th Multinational Congress on Microscopy (MCM 2011). (2011)
294.
Konferenzbeitrag
Cha, L.; Clemens, H. J.; Dehm, G.; Zhang, Z.: In-situ TEM heating study of the γ lamellae formation inside the α2 matrix of a Ti-45Al-7.5Nb alloy. 2010 International Conference on Advances in Materials and Manufacturing Processes, ICAMMP 2010;Code 83174, Shenzhen, China, 06. November 2010 - 08. November 2020. Advanced Materials Research 146-147, S. 1365 - 1368 (2011)
295.
Konferenzbeitrag
Clemens, H. J.; Schmoelzer, T.; Schloffer, M.; Schwaighofer, E.; Mayer, S.; Dehm, G.: Physical metallurgy and properties of β-solidifying TiAl based alloys. In: Materials Research Society symposium proceedings, Bd. 1295, S. 95 - 100. Materials Research Society Symposium N – Intermetallic-Based Alloys for Structural and Functional Applications , San Francisco, CA, USA, 25. April 2011 - 29. April 2011. Materials Research Society: MRS, Leoben, Austria (2011)
296.
Konferenzbeitrag
Dehm, G.; Kiener, D.: Obtaining a quantitative micro- and nano-mechanical understanding of metals using in situ electron microscopy. In: MCM 2011, S. 599 - 600. 10th Multinational Congress on Microscopy (MCM 2011), Urbino, Italy, 04. September 2011 - 09. September 2011. Urbino, Italy (2011)
297.
Konferenzbeitrag
Dehm, G.; Raj, R.; Rühle, M.: Measurement of the Interfacial Shear Strength of Thin Copper Films on Sapphire by Microindentation Experiments. In: Materials Research Symposium Proceedings 1996 (Symposium I – Polycrystalline Thin Films: Structure, Texture, Properties and Applications II), Bd. 403, S. 151 - 156. 1996 MRS Fall Meeting & Exhibit, Boston, MA, USA, 02. Dezember 1996 - 06. Dezember 1996. Materials Research Society, Boston, MA, USA (2011)
298.
Konferenzbeitrag
Kiener, D.; Kirchlechner, C.; Zhang, Z.; Ulrich, O.; Micha, J.-S.; Dehm, G.: Plasticity of FIB fabricated micro-samples investigated by in-situ micro-Laue diffraction and in-situ TEM. In: 10th Multinational Congress on Microscopy (MCM 2011), S. 129 - 130. 10th Multinational Congress on Microscopy (MCM 2011), Urbino, Italy , 04. September 2011 - 09. September 2011. (2011)
299.
Konferenzbeitrag
Huang, R.; Robl, W.; Dehm, G.; Ceric, H.; Detzel, T.: Disparate tendency of stress evolution of thin and thick electroplated Cu films at room temperature. In: Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, 5532222, S. 1 - 6. International Symposium on the Physical and Failure Analysis of Integrated Circuits IPFA 2010, Singapore, Singapore, 05. Juli 2010 - 09. Juli 2010. IEEE (2010)
300.
Konferenzbeitrag
Cordill, M. J.; Taylor, A. A.; Schalko, J.; Dehm, G.; Dehm, G.: Fracture and Delamination of Chromium Thin Films on Polymer Substrates. Symposium on Mechanical Behavior of Nanostructured Materials held at the 2009 TMS Annual Meeting and Exhibition, San Francisco, CA, USA, 15. Februar 2009 - 19. Februar 2009. Metallurgical and Materials Transactions A 41 (4), S. 870 - 875 (2010)
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