Publikationen von Darius Tytko

Tytko, D.; Choi, P.-P.; Raabe, D.: Oxidation behavior of AlN/CrN multilayered hard coatings. Nano Convergence 4 (1), S. 15 - 15 (2017)

Pristovsek, M.; Han, Y.; Zhu, T.; Oehler, F.; Tang, F.; Oliver, R. A.; Humphreys, C. J.; Tytko, D.; Choi, P.-P.; Raabe, D. et al.; Brunner, F.; Weyers, M.: Structural and optical properties of (1122) InGaN quantum wells compared to (0001) and (1120). Semiconductor Science and Technology 31 (8), 085007 (2016)

Lapauw, T.; Tytko, D.; Vanmeensel, K.; Huang, S.; Choi, P.-P.; Raabe, D.; Caspi, E. N.; Ozeri, O.; To Baben, M.; Schneider, J. M. et al.; Lambrinou, K.; Vleugels, J.: (Nbx, Zr_1-x)₄AlC₃ MAX Phase Solid Solutions: Processing, Mechanical Properties, and Density Functional Theory Calculations. Inorganic Chemistry 55 (11), S. 5445 - 5452 (2016)

Friák, M.; Tytko, D.; Holec, D.; Choi, P.-P.; Eisenlohr, P.; Raabe, D.; Neugebauer, J.: Synergy of atom-probe structural data and quantum-mechanical calculations in a theory-guided design of extreme-stiffness superlattices containing metastable phases. New Journal of Physics 17 (9), 093004 (2015)

Krause, F. F.; Ahl, J.-P.; Tytko, D.; Choi, P.-P.; Egoavil, R.; Schowalter, M.; Mehrtens, T.; Müller-Caspary, K.; Verbeeck, J.; Raabe, D. et al.; Hertkorn, J.; Engl, K.; Rosenauer, A.: Homogeneity and composition of AlInGaN: A multiprobe nanostructure study. Ultramicroscopy 156, S. 29 - 36 (2015)

Tytko, D.; Choi, P.-P.; Raabe, D.: Thermal dissolution mechanisms of AlN/CrN hard coating superlattices studied by atom probe tomography and transmission electron microscopy. Acta Materialia 85, S. 32 - 41 (2015)

Raabe, D.; Herbig, M.; Sandlöbes, S.; Li, Y.; Tytko, D.; Kuzmina, M.; Ponge, D.; Choi, P.-P.: Grain boundary segregation engineering in metallic alloys: A pathway to the design of interfaces. Current Opinion in Solid State and Materials Science 18 (4), S. 253 - 261 (2014)

Povstugar, I.; Choi, P.; Tytko, D.; Ahn, J.; Raabe, D.: Interface-directed spinodal decomposition in TiAlN/CrN multilayer hardcoatings studied by atom probe tomography. Acta Materialia 61 (20), S. 7534 - 7542 (2013)

Mehrtens, T.; Schowalter, M.; Tytko, D.; Choi, P.-P.; Raabe, D.; Hoffmann, L.; Jönen, H.; Rossow, U.; Hangleiter, A.; Rosenauer, A.: Measurement of the indium concentration in high indium content InGaN layers by scanning transmission electron microscopy and atom probe tomography. Applied Physics Letters 102 (13), 132112 (2013)

Sandim, M. J. R.; Tytko, D.; Kostka, A.; Choi, P.; Awaji, S.; Watanabe, K.; Raabe, D.: Grain boundary segregation in a bronze-route Nb₃Sn superconducting wire studied by atom probe tomography. Superconductor Science and Technology 26, S. 055008-1 - 055008-7 (2013)

Tytko, D.; Choi, P.-P.; Klöwer, J.; Inden, G.; Raabe, D.: Microstructural evolution of a Ni-based superalloy (617B) at 700 °C studied by electron microscopy and atom probe tomography. Acta Materialia 60 (4), S. 1731 - 1740 (2012)

Mehrtens, T.; Schowalter, M.; Tytko, D.; Choi, P.-P.; Raabe, D.; Hoffmann, L.; Jönen, H.; Rossow, U.; Hangleiter, A.; Rosenauer, A.: Measuring composition in InGaN from HAADF-STEM images and studying the temperature dependence of Z-contrast. In: Journal of Physics: Conference Series, Bd. 471, 012009. 18th Microscopy of Semiconducting Materials Conference, MSM 2013, Oxford, UK, 07. April 2013 - 11. April 2013. (2013)

Jägle, E. A.; Tytko, D.; Choi, P.-P.; Raabe, D.: Deformation-induced intermixing in a model multilayer system. Atom Probe Tomography & Microscopy 2014, Stuttgart, Germany (2014)

Povstugar, I.; Choi, P.; Tytko, D.; Raabe, D.: Atom probe tomography for nanoscale analysis of nitride thin films. 7th International Conference on Surfaces, Coatings and Nanostructured Materials NANOSMAT-2012, Prague, Chech Republic (2012)

Tytko, D.: Thermal stability of AlN/CrN superlattice hard coatings. Dissertation, RWTH Aachen University, Aachen, Germany (2015)

Tytko, D.: Untersuchung der Grenzflächen von Nickel-Basis Legierungen mittels Atomsondentomograpie. Diplom, Heinrich-Heine Universität Düsseldorf, Düsseldorf [Germany] (2010)