Zeitschriftenartikel
Topore, G.; Douglas, J.; Coke, M.; Curry, R.; Griffin, S.; Keeney, L.; Gault, B.; Conroy, M.: Where is my Ion? Correlative STEM and APT Analysis of Low-Dose Magnetic Ion Implantation in Ferroelectric Materials. Microscopy and Microanalysis
31 (7), S. 1136 - 1138 (2025)