Publikationen von Christina Scheu

Dehm, G.; Scheu, C.; Möbus, G.; Brydson, R.; Rühle, M.: Synthesis of Analytical and High Resolution Transmission Electron Microscopy to Determine the Interface Structure of Cu/Al₂O₃. Ultramicroscopy 67 (1-4), S. 207 - 217 (1997)

Dehm, G.; Ernst, F.; Mayer, J.; Möbus, G.; Müllejans, H.; Phillipp, F.; Scheu, C.; Rühle, M.: Transmission Electron Microscopy at the Max-Planck-Institut für Metallforschung. Zeitschrift für Metallkunde 87 (11), S. 898 - 910 (1996)

Dehm, G.; Scheu, C.; Raj, R.; Rühle, M.: Growth, structure and interfaces of Cu and Cu/Ti thin films on (0001)alpha-Al₂O₃. Materials Science Forum 207-209 (1), S. 217 - 220 (1996)

Scheu, C.; Dehm, G.; Müllejans, H.; Rühle, M.: Electron Energy-Loss Spectroscopy at Cu/Al₂O₃ and Ti/Al₂O₃ Interfaces. Materials Science Forum 207-209 (1), S. 181 - 184 (1996)

Scheu, C.; Dehm, G.; Müllejans, H.; Brydson, R.; Rühle, M.: Electron Energy-Loss Near-Edge Structure of Metal-Alumina Interfaces. Microscopy Microanalysis Microstructures 6 (1), S. 19 - 31 (1995)

Clemens, H.; Mayer, S.; Scheu, C.: Microstructure and Properties of Engineering Materials. In: Neutrons and Synchrotron Radiation in Engineering Materials Science: From Fundamentals to Applications: Second Edition, S. 3 - 20 (Hg. Schreyer, A.; Clemens, H.; Mayer, S.). wiley, Hoboken, NJ, USA (2017)

Microstructure of Ni₂B Laser-Induced Surface-Alloyed α-Fe (Materials Resaerch Symposium Proceedings, Phase Transformations and Systems Driven far from Equilibrium, 481). MRS Fall Meeting´97, Boston, MA, USA. (2001)

Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Dehm, G.; Scheu, C.: In situ electron microscopy – insights in solid state dewetting of epitaxial Al thin films on sapphire. In: Microscopy Conference 2017 (MC 2017) - Proceedings (Hg. Laue, M.). Microscopy Conference 2017 (MC 2017), Lausanne, Switzerland, 21. August 2017 - 25. August 2017. Universität Regensburg, Regensburg (2017)

Folger, A.; Wisnet, A.; Scheu, C.: Defects in as-grown vs. annealed rutile titania nanowires and their effect on properties. EMC 2016, 16th European Microscopy Congress, Lyon, France, 28. August 2016 - 02. September 2016. European Microscopy Congress 2016: Proceedings, S. 409 - 410 (2016)

Hieke, S. W.; Dehm, G.; Scheu, C.: Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy. In: European Microscopy Congress 2016: Proceedings, S. 203 - 204. The 16th European Microscopy Congress (EMC 2016), Lyon, France, 28. August 2016 - 02. September 2016. Wiley-VCH Verlag GmbH & Co KGaA (2016)

Liebscher, C.; Stoffers, A.; Cojocaru-Mirédin, O.; Gault, B.; Scheu, C.; Dehm, G.; Raabe, D.: Topological Impurity Segregation at Faceted Silicon Grain Boundaries Studied by Correlative Atomic-Resolution STEM and APT. In: Microscopy and Microanalysis, Bd. 22, S. 46 - 47. 3rd Conference on In Situ and Correlative Electron Microscopy (CISCEM 2016) , Saarbrücken, Germany, 11. Oktober 2016 - 12. Oktober 2016. (2016)

Guggenmos, A.; Radünz, S.; Rauhut, R.; Hofstetter, M.; Venkatesan, S.; Wochnik, A. S.; Scheu, C.; Gullikson, E. M.; Fischer, S.; Nickel, B. et al.; Kleineberg, U.: Attosecond broadband multilayer mirrors for the water window spectral range. In: Proceedings of SPIE, Bd. 9207, 92070L (Hg. Morawe, C.; Khounsary, A. M.; Goto, S.). Conference on Advances in X-Ray/EUV Optics and Components IX held as part of the SPIE 2014 International Symposium on Optics + Photonics, San Diego, CA, USA, 18. August 2014 - 20. August 2014. (2014)

Cha, L.; Scheu, C.; Dehm, G.: A TEM study of ultra-fine lamellar structures in titanium aluminide. In: 9th Multinational Microscopy Conference 2009 Materials Science, Bd. 3, S. 247 - 248 (Hg. Kothleitner, G.; Leisch, M.). 9th Multinational Microscopy Conference 2009, Graz, Austria, 30. August 2009 - 04. September 2009. Verlag der Technischen Universität Graz, Graz, Austria (2009)

Cha, L.; Scheu, C.; Dehm, G.; Schnitzer, R.; Clemens, H. J.: Initial stages of lamellae formation in high Nb containing γ-TiAl based alloys. In: Materials Research Society Symposium Proceedings 2009, Bd. 1128, S. 153 - 158. MRS Fall Meeting 2009, Boston, MA, USA, 30. November 2009 - 04. Dezember 2009. (2009)

Rashkova, B.; Zhang, Z.; Šturm, S.; Kothleitner, G.; Kutschej, K.; Mitterer, C.; Lazar, P.; Redinger, J.; Podloucky, R.; Scheu, C. et al.; Dehm, G.: EELS Measurements and Ab-initio Calculations of the N–K Edge in TiN/VN Films Deposited on MgO Substrates. In: 9th Multinational Microscopy Conference 2009, S. 285 - 286 (Hg. Kothleitner, G.). 9th Multinational Microscopy Conference 2009, Graz, Austria, 30. August 2009 - 04. September 2008. Verlag der Technischen Universität Graz, Graz, Austria (2009)

Rester, M.; Cha, L.; Scheu, C.; Dehm, G.; Clemens, H. J.; Kothleitner, G.; Leisch, M.: Microstructure of a massively transformed high Nb containing γ-TiAl based alloy. In: 9th Multinational Microscopy Conference 2009, S. 231 - 232 (Hg. Kothleitner, G.; Leisch, M.). 9th Multinational Microscopy Conference 2009, Graz, Austria, 30. August 2009. Verlag der Technischen Universität Graz, Graz, Austria (2009)

Rashkova, B.; Kothleitner, G.; Šturm, S.; Scheu, C.; Kutschej, K.; Mitterer, C.; Lazar, P.; Redinger, J.; Podloucky, R.; Dehm, G.: A Comparison of the Electronic Structure of N–K in TiN and VN using EELS and Ab-initio Calculations. In: Proceeding 33rd Microscopy Conference, Deutsche Gesellschaft für Elektronenmikroskopie, S. 414 - 415. Microscopy 33rd Conference, Deutsche Gesellschaft für Elektronenmikroskopie, Saarbrücken, Germany, 02. September 2007 - 07. September 2007. (2007)

Wetscher, F.; Pippan, R.; Šturm, S.; Kauffmann, F.; Scheu, C.; Dehm, G.: Microstructural evolution of a pearlitic steel during severe plastic deformation. In: 7th Multinational Congress on Microscopy. 7th Multinational Congress on Microscopy, Portorož, Slovenia, 26. Juni 2005 - 30. Juni 2005. (2005)

Oh, S. H.; Scheu, C.; Dehm, G.; Wagner, T. A.; Rühle, M.; Lee, H. J.: Direct atomic scale observation of dynamic alumina-aluminum solid-liquid interfaces. In: The 8th Asia-Pacific Conference on Electron Microscopy (8APEM): In Conjunction with the 60th Annual Meeting of the Japanese Society of Microscopy, S. 671 - 672. 8th Asia-Pacific Conference on Electron Microscopy (8APEM), Kanazawa, Japan, 07. Juni 2004 - 11. Juni 2004. Die Japanische Gesellschaft für Mikroskopie, Uchinada-mati (Isikawa-ken), Japan (2004)

Dehm, G.; Scheu, C.; Rühle, M.: Interface Structure of Epitaxial Cu Films on (0001) α-Al₂O₃. In: Proceedings of the 14th ICEM, Bd. 2, S. 567 - 568. 11th International Congress on Electron Microscopy, Dublin, Ireland, 26. August 1996 - 30. August 1996. (1998)