Zeitschriftenartikel
Keil, P.; Frahm, R.; Lützenkirchen-Hecht, D.: Native oxidation of sputter deposited polycrystalline copper thin films during short and long exposure times: Comparative investigation by specular and non-specular grazing incidence X-ray absorption spectroscopy. Corrosion Science
52, S. 1305 - 1305 (2010)