Konferenzbeitrag
Petrov, M.; Holec, D.; Lymperakis, L.; Neugebauer, J.; Humphreys, C. J.: Strain-induced effects on the electronic structure and N K-edge ELNES of wurtzite AlN and AlxGa1-xN. 17th International Conference on Microscopy of Semiconducting Materials 2011, University of Cambridge, UK, 04. April 2011 - 07. April 2011. Journal of Physics Conference Series
326, S. 012016-1 - 012016-5 (2011)