Suchergebnisse

Wei, Y.; Peng, Z.; Kühbach, M.; Breen, A. J.; Legros, M.; Larranaga, M.; Mompiou, F.; Gault, B.: 3D nanostructural characterisation of grain boundaries in atom probe data utilising machine learning methods. PLoS One 19, S. 1 - 19 (2019)

Wei, Y.; Gault, B.; Varanasi, R. S.; Raabe, D.; Herbig, M.; Breen, A. J.: Machine-learning-based atom probe crystallographic analysis. Ultramicroscopy 194, S. 15 - 24 (2018)