Zeitschriftenartikel (2)

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    Cui, Y.; Lee, S.; Freysoldt, C.; Neugebauer, J.: Role of biaxial strain and microscopic ordering for structural and electronic properties of InxGa1-xN. Physical Review B 92 (8), 085204, S. 5204 - 5210 (2015)
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    Lee, S.; Freysoldt, C.; Neugebauer, J.: Ordering phenomena and formation of nanostructures in InxGa1−xN layers coherently grown on GaN(0001). Physical Review B 90 (24), 245301 (2014)

Vortrag (2)

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    Kiener, D.; Oh, S. H.; Lee, S.; Jeong, J.; Minor, A. M.; Kunz, M.; Tamura, N.; Gruber, P. A.; Hoo, R. P.; Kirchlechner, C. et al.; Alfreider, M.; Treml, R.: In situ mechanical testing in electron microscopes to study small scale deformation mechanisms. ECI on Nanomechanical Testing 2013, Olhão (Algarve), Portugal (2013)
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    Uyar, F.; Gruber, J.; Lee, S.; Winning, M.; Rollett, A. D.: Stagnation of Thin Film Grain Growth under the Effect of a Stress Field. Materials Science & Technology 2009 Conference, Pittsburgh, PA, USA (2009)
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