Suchergebnisse

Cha, L.; Scheu, C.; Dehm, G.: A TEM study of ultra-fine lamellar structures in titanium aluminide. In: 9th Multinational Microscopy Conference 2009 Materials Science, Bd. 3, S. 247 - 248 (Hg. Kothleitner, G.; Leisch, M.). 9th Multinational Microscopy Conference 2009, Graz, Austria, 30. August 2009 - 04. September 2009. Verlag der Technischen Universität Graz, Graz, Austria (2009)

Cha, L.; Scheu, C.; Dehm, G.; Schnitzer, R.; Clemens, H. J.: Initial stages of lamellae formation in high Nb containing γ-TiAl based alloys. In: Materials Research Society Symposium Proceedings 2009, Bd. 1128, S. 153 - 158. MRS Fall Meeting 2009, Boston, MA, USA, 30. November 2009 - 04. Dezember 2009. (2009)

Motz, C.; Kiener, D.; Kirchlechner, C.; Matoy, K.; Wurster, S.; Dehm, G.; Pippan, R.: Determination of micro-mechanical properties: In-situ compression, tension and fracture testing within the SEM. In: 9th Multinational Microscopy Conference 2009, S. 501 - 502 (Hg. Kothleitner, G.; Leisch, M.). 9th Multinational Microscopy Conference 2009, Graz, Austria, 30. August 2009 - 04. September 2009. Verlag der Technischen Universität Graz, Graz, Austria (2009)

Rashkova, B.; Moser, G.; Felber, H.; Grosinger, W.; Zhang, Z.; Motz, C.; Dehm, G.: A Novel Preparation Route to Obtain Micro-Bending Beams for In-situ TEM Studies. In: Instrumentation and Methodology, Bd. 1, S. 249 - 250. 9th Multinational Microscopy Conference 2009, Institute for Electron Microscopy Graz, University of Technology , Graz, Austria, 30. August 2009. Verlag der Technischen Universität Graz, Graz, Austria (2009)

Rashkova, B.; Zhang, Z.; Šturm, S.; Kothleitner, G.; Kutschej, K.; Mitterer, C.; Lazar, P.; Redinger, J.; Podloucky, R.; Scheu, C. et al.; Dehm, G.: EELS Measurements and Ab-initio Calculations of the N–K Edge in TiN/VN Films Deposited on MgO Substrates. In: 9th Multinational Microscopy Conference 2009, S. 285 - 286 (Hg. Kothleitner, G.). 9th Multinational Microscopy Conference 2009, Graz, Austria, 30. August 2009 - 04. September 2008. Verlag der Technischen Universität Graz, Graz, Austria (2009)

Rester, M.; Cha, L.; Scheu, C.; Dehm, G.; Clemens, H. J.; Kothleitner, G.; Leisch, M.: Microstructure of a massively transformed high Nb containing γ-TiAl based alloy. In: 9th Multinational Microscopy Conference 2009, S. 231 - 232 (Hg. Kothleitner, G.; Leisch, M.). 9th Multinational Microscopy Conference 2009, Graz, Austria, 30. August 2009. Verlag der Technischen Universität Graz, Graz, Austria (2009)

Zhang, Z.; Rashkova, B.; Dehm, G.; Lazar, P.; Redinger, J.; Podloucky, R.: Atomic and electronic structural studies of VN/MgO (001) interface by an image-side C_s-corrected electron microscope. In: 9th Multinational Microscopy Conference 2009, S. 15 - 16 (Hg. Kothleitner, G.; Leisch, M.). 9th Multinational Microscopy Conference 2009, Graz, Austria, 30. August 2009 - 04. September 2009. (2009)

Kiener, D.; Jörg, T.; Rester, M.; Motz, C.; Dehm, G.: Conventional TEM Investigation of the FIB Damage in Copper. In: Proceeding 33rd Microscopy Conference, Deutsche Gesellschaft für Elektronenmikroskopie, S. 100 - 101. 33rd Microscopy Conference, Deutsche Gesellschaft für Elektronenmikroskopie, Saarbrücken, Germany, 02. September 2007 - 07. September 2007. (2007)

Oh, S. H.; Legros, M.; Kiener, D.; Gruber, P. A.; Dehm, G.: Size-Induced Transition from Perfect to Partial Dislocation Plasticity in Single Crystal Au Films on Polyimide. In: Proceeding Microscopy 33rd Conference, Deutsche Gesellschaft für Elektronenmikroskopie, S. 278 - 279. Microscopy 33rd Conference, Deutsche Gesellschaft für Elektronenmikroskopie, Saarbrücken, Germany, 02. September 2007 - 07. September 2007. (2007)

Rashkova, B.; Kothleitner, G.; Šturm, S.; Scheu, C.; Kutschej, K.; Mitterer, C.; Lazar, P.; Redinger, J.; Podloucky, R.; Dehm, G.: A Comparison of the Electronic Structure of N–K in TiN and VN using EELS and Ab-initio Calculations. In: Proceeding 33rd Microscopy Conference, Deutsche Gesellschaft für Elektronenmikroskopie, S. 414 - 415. Microscopy 33rd Conference, Deutsche Gesellschaft für Elektronenmikroskopie, Saarbrücken, Germany, 02. September 2007 - 07. September 2007. (2007)

Dehm, G.; Legros, M.; Heiland, B.: In-situ TEM straining experiments of Al films on polyimide using a novel FIB design for specimen preparation. 10th Meeting on Frontiers of Electron Microscopy in Materials Science, Maastricht, The Netherlands, 25. September 2005 - 30. September 2005. Journal of Materials Science 41 (14), S. 4484 - 4489 (2006)

Oh, S. H.; Kiener, D.; Legros, M.; Gruber, P. A.; Arzt, E.; Dehm, G.: In-situ TEM tensile testing of thin Au films: A transition in deformation mechanism. Meeting at Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Leoben, Austria., (2006)

Sonnweber-Ribic, P.; Dehm, G.; Gruber, P. A.; Arzt, E.: Strain energy effects on texture evolution in thin films: Biaxial vs. uniaxial stress state. 8th International Workshop on Stress-Induced Phenomena in Metallization; Code 68627, Dresden; Germany, 12. September 2005 - 14. September 2005. AIP Conference Proceedings 817, S. 192 - 197 (2006)

Wiederhirn, G.; Balk, T. J.; Dehm, G.; Nucci, J. A.; Richter, G.; Arzt, E.: Passivation Effects in Copper Thin Films. 8th International Workshop on Stress-Induced Phenomena in Metallization, Dresden; Germany, 12. September 2005 - 14. September 2005. AIP Conference Proceedings 817, S. 185 - 191 (2006)

Wübben, T.; Dehm, G.; Arzt, E.: Thermomechanical behavior of thin metal films under different ambient conditions. In: AIP Conference Proceedings, Bd. 817, S. 98 - 103. 8th International Workshop on Stress-Induced Phenomena in Metallization; Code 68627, Dresden; Germany, 12. September 2005 - 14. September 2005. (2006)

Kiener, D.; Motz, C.; Dehm, G.: In-Situ compression tests on micron-sized copper pillars. Meeting at Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Leoben, Austria, 29. Januar 2006., (2006)

Legros, M.; Dehm, G.; Balk, T. J.: In-Situ TEM Study of Plastic Stress Relaxation Mechanisms and Interface Effects in Metallic Films. In: MRS Proceedings, Bd. 875. 2005 MRS Spring Meeting. (2005)

Bischof , M.; Mayer, S.; Leitner, H.; Clemens , H.; Pranzas, K.; Staron, P.; Dehm, G.; Knabl , W.; Voiticek, A.; Geiger, E.: Microstructure and Mechanical Properties of Si and Y Doped Tantalum. In: Proceedings of the 16th International Plansee Seminar 2005, Bd. 1, S. 489 - 503. 16th International Plansee Seminar 2005, Reutte, Austria, 30. Mai 2005 - 03. Juni 2005. (2005)

Bystrzanowski, S.; Bartels, A.; Clemens, H.; Gerling, R. W.; Schimansky, F. P.; Dehm, G.: Creep Behavior and Microstructural Stability of Ti-46Al-9Nb with Different Microstructures. In: MRS Proceedings, Symposium S – Integrative and Interdisciplinary Aspects of Intermetallics, Bd. 842, S7.12, S. 121 - 126. 2004 MRS Fall Meeting, Boston, MA, USA, 29. November 2004 - 01. Dezember 2004. (2005)

Dehm, G.: Plasticity and Fracture of Metallic thin Films. In: CD ROM. 11th International Conference on Fracture 2005 ICF11, Turin, Italy, 20. März 2005 - 25. März 2005. (2005)