Suchergebnisse

Zeitschriftenartikel (1)

1.
Zeitschriftenartikel
Cautaerts, N.; Rauch, E. F.; Jeong, J.; Dehm, G.; Liebscher, C.: Investigation of the orientation relationship between nano-sized G-phase precipitates and austenite with scanning nano-beam electron diffraction using a pixelated detector. Scripta Materialia 201, 113930 (2021)

Vortrag (7)

2.
Vortrag
Jeong, J.: Advanced transmission electron microscopy of nanomaterials using In-situ TEM and precession electron diffraction. Talk at Korea Institute of Industrial Technology (KITECH), Seoul, South Korea (2019)
3.
Vortrag
Jeong, J.: Advanced transmission electron microscopy of nanomaterials using In-situ TEM and precession electron diffraction. Talk at Korea Institute of Materials Science (KIMS), Seoul, South Korea (2019)
4.
Vortrag
Jeong, J.: Advanced transmission electron microscopy of nanomaterials using In-situ TEM and precession electron diffraction. Talk at Korea Institute of Science and Technology (KIST), Seoul, South Korea (2019)
5.
Vortrag
Jeong, J.; Dehm, G.; Liebscher, C.: Advances in automatic TEM based orientation mapping with precession electron diffraction. KSM Annual Fall Conference 2019, Gyeongju, South Korea (2019)
6.
Vortrag
Jeong, J.; Kim, J.; Kiener, D.; Oh, S. H.: In-situ TEM observation of twin-dominated deformation of Mg single crystals. KSM Annual Fall Conference 2019, Gyeongju, South Korea (2019)
7.
Vortrag
Arigela, V. G.; Oellers, T.; Luo, W.; Jeong, J.; Stein, F.; Ludwig, A.; Kirchlechner, C.; Dehm, G.: Development and applications of a high temperature nano-/micro mechanics device with a novel temperature measurement approach. Euromat 2019, Stockholm, Sweden (2019)
8.
Vortrag
Jeong, J.; Dehm, G.; Liebscher, C.: Advances in automatic TEM based orientation mapping with precession electron diffraction. Joint Max-Planck-Institut für Eisenforschung MPIE) / Ernst Ruska-Centre (ER-C) Workshop, Düsseldorf, Germany (2019)

Poster (1)

9.
Poster
Jeong, J.; Dehm, G.; Liebscher, C.: Advances in automatic TEM based orientation mapping with precession electron diffraction. International Workshop on Advanced In Situ Microscopies of Functional Nanomaterials and Devices (IAMnano 2019), Düsseldorf, Germany (2019)
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