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Zeitschriftenartikel (5)

1.
Zeitschriftenartikel
El-Zoka, A.; Kim, S.-H.; Deville, S.; Newman, R. C.; Stephenson, L.; Gault, B.: Enabling near-atomic–scale analysis of frozen water. Science Advances 6 (49), eabd6324 (2020)
2.
Zeitschriftenartikel
Nadarajah, R.; Tahir, S.; Landers, J.; Koch, D.; Semisalova, A. S.; Wiemeler, J.; El-Zoka, A.; Kim, S.-H.; Utzat, D.; Möller, R. et al.; Gault, B.; Wende, H.; Farle, M.; Gökce, B.: Controlling the Oxidation of Magnetic and Electrically Conductive Solid-Solution Iron-Rhodium Nanoparticles Synthesized by Laser Ablation in Liquids. Nanomaterials 10 (12), 2362 (2020)
3.
Zeitschriftenartikel
Lim, J.; Kim, S.-H.; Aymerich Armengol, R.; Kasian, O.; Choi, P.-P.; Stephenson, L.; Gault, B.; Scheu, C.: Atomic‐Scale Mapping of Impurities in Partially Reduced Hollow TiO2 Nanowires. Angewandte Chemie, International Edition in English 59 (14), S. 5651 - 5655 (2020)
4.
Zeitschriftenartikel
Kim, S.-H.; Lim, J.; Sahu, R.; Kasian, O.; Stephenson, L.; Scheu, C.; Gault, B.: Direct Imaging of Dopant and Impurity Distributions in 2D MoS2. Advanced Materials 32 (8), 1907235 (2020)
5.
Zeitschriftenartikel
Zhang, S.; Ahmet, I.; Kim, S.-H.; Kasian, O.; Mingers, A. M.; Schnell, P.; Kölbach, M.; Lim, J.; Fischer, A.; Mayrhofer, K. J. J. et al.; Cherevko, S.; Gault, B.; van de Krol, R.; Scheu, C.: Different Photostability of BiVO4 in Near-pH-Neutral Electrolytes. ACS Applied Energy Materials (2020)

Vortrag (2)

6.
Vortrag
Raabe, D.; Kim, S.-H.; Zhang, X.; Schweinar, K.; Souza Filho, I. R.; Ma, Y.; Stephenson, L.; El-Zoka, A.; Mianroodi, J. R.; Rohwerder, M. et al.; Lilensten, L.; Paolantonio, M.; Thoudden Sukumar, P.; Schneider, J. M.; Ponge, D.; Gault, B.: Basic Research Opportunity and Leverage Effects in Sustainable Metallurgy. Workshop “New Frontiers in Materials Science and Engineering – Sustainable Metallurgical Processes with improved CO2 efficiency” at RWTH Aachen (online), Aachen, Germany (2020)
7.
Vortrag
Lim, J.; Kim, S.-H.; Sahu, R.; Aymerich Armengol, R.; Kasian, O.; Choi, P.-P.; Stephenson, L.; Gault, B.; Scheu, C.: Detection of trace impurities and other defects in functional nanomaterials. International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, IAMNano 2019 , Düsseldorf, Germany (2019)
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