Publikationen von Gerhard Dehm

Yang, B.; Motz, C.; Grosinger, W.; Kammrath, W.; Dehm, G.: Tensile behaviour of micro-sized copper wires studied by a novel fibre tensile module. International Journal of Materials Research 99 (7), S. 716 - 724 (2008)

Kiener, D.; Motz, C.; Dehm, G.: Dislocation-induced crystal rotations in micro-compressed single crystal copper columns. Journal of Materials Science 43 (7), S. 2503 - 2506 (2008)

Kiener, D.; Grosinger, W.; Dehm, G.; Pippan, R.: A further step towards an understanding of size-dependent crystal plasticity: In situ tenison experiments of miniaturized single-crystal copper samples. Acta Materialia 56 (3), S. 580 - 592 (2008)

Robertson, I. M.; Ferreira, P. J.; Dehm, G.; Hull, R. V.; Stach, E. A.: Visualizing the behavior of dislocations - Seeing is believing. MRS Bulletin 33 (2), S. 122 - 131 (2008)

Bamberger, M. S.; Dehm, G.: Trends in the development of new Mg alloys. Annual Review of Materials Research 38, S. 505 - 533 (2008)

Lazar, P.; Redinger, J.; Strobl, J.; Podloucky, R.; Rashkova, B.; Dehm, G.; Kothleitner, G.; Šturm, S.; Kutschej, K.; Mitterer, C. et al.; Scheu, C.: N–K electron energy-loss near-edge structures for TiN/VN layers: an ab initio and experimental study. Analytical and Bioanalytical Chemistry 390 (6), S. 1447 - 1453 (2008)

Maaß, R.; Van Petegem, S. V.; Grolimund, D.; Van Swygenhoven, H.; Kiener, D.; Dehm, G.: Crystal rotation in Cu single crystal micropillars: In situ Laue and electron backscatter diffraction. Applied Physics Letters 92 (7), 071905 (2008)

Kutschej, K.; Rashkova, B.; Shen, J.; Edwards, D.; Mitterer, C.; Dehm, G.: Experimental studies on epitaxially grown TiN and VN films. Thin Solid Films 516 (2-4), S. 369 - 373 (2007)

Rashkova, B.; Lazar, P.; Redinger, J.; Podloucky, R.; Kothleitner, G.; Šturm, S.; Kutschej, K.; Mitterer, C.; Scheu, C.; Dehm, G.: Combined ab-initio and N–K, Ti-L_2,3, V-L_2,3 electron energy-loss near edge structure studies for TiN and VN films. Zeitschrift für Metallkunde/Materials Research and Advanced Techniques 98 (11), S. 1060 - 1065 (2007)

Dehm, G.; Oh, S. H.; Gruber, P. A.; Legros, M.; Fischer, F. D.: Strain compensation by twinning in Au thin films: Experiment and model. Acta Materialia 55 (19), S. 6659 - 6665 (2007)

Kiener, D.; Rester, M.; Scheriau, S.; Yang, B.; Pippan, R.; Dehm, G.: Influence of external and internal length scale on the flow stress of copper. International Journal of Materials Research 98 (11), S. 1047 - 1053 (2007)

Inkson, B. J.; Dehm, G.; Peng, Y.: Dynamical growth of Cu-Pt nanowires with a nanonecklace morphology. Nanotechnology 18 (41), 415601, S. 1 - 5 (2007)

Oh, S. H.; Legros, M.; Kiener, D.; Gruber, P. A.; Dehm, G.: In situ TEM straining of single crystal Au films on polyimide: Change of deformation mechanisms at the nanoscale. Acta Materialia 55 (16), S. 5558 - 5571 (2007)

Kiener, D.; Motz, C.; Rester, M.; Jenko, M.; Dehm, G.: FIB damage of Cu and possible consequences for miniaturized mechanical tests. Materials Science and Engineering A: Structural Materials Properties Microstructure and Processing 459 (1-2), S. 262 - 272 (2007)

Eiper, E.; Kečkéš, J.; Martinschitz, K. J.; Zizak, I.; Cabié, M.; Dehm, G.: Size-independent stresses in Al thin films thermally strained down to -100°C. Acta Materialia 55 (6), S. 1941 - 1946 (2007)

Clemens, H. J.; Bartels, A.; Bystrzanowski, S.; Chladil, H. F.; Leitner, H.; Dehm, G.; Gerling, R. W.; Schimansky, F. P.: Grain refinement in γ-Ti–Al-based alloys by solid state phase transformations. Intermetallics 14 (12), S. 1380 - 1385 (2006)

Kiener, D.; Motz, C.; Schöberl, T.; Jenko, M.; Dehm, G.: Determination of mechanical properties of copper at the micron scale. Advanced Engineering Materials 8 (11), S. 1119 - 1125 (2006)

Dehm, G.; Motz, C.; Scheu, C.; Clemens, H. J.; Mayrhofer, P. H.; Mitterer, C.: Mechanical size-effects in miniaturized and bulk materials. Advanced Engineering Materials 8 (11), S. 1033 - 1045 (2006)

Kečkéš, J.; Eiper, E.; Martinschitz, K. J.; Boesecke, P.; Gindl, W.; Dehm, G.: In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale. Advanced Engineering Materials 8 (11), S. 1084 - 1088 (2006)

Sonnweber-Ribic, P.; Gruber, P.; Dehm, G.; Arzt, E.: Texture transition in Cu thin films: electron backscatter diffraction vs. X-ray diffraction. Acta Materialia 54 (15), S. 3863 - 3870 (2006)