Zeitschriftenartikel
Vaxelaire, N.; Proudhon, H.; Labat, S.; Kirchlechner, C.; Kečkéš, J.; Jacques, V.; Ravy, S.; Forest, S.; Thomas, O.: Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction. New Journal of Physics
12, 035018, S. 1 - 12 (2010)