Suchergebnisse

Buch (26)

4361.
Buch
Krüger, T.: Computer simulation study of collective phenomena in dense suspensions of red blood cells under shear. Springer Spektrum, Heidelberg (2012), 165 S.
4362.
Buch
Dehm, G.; Zweck, J.: In-situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science. Wiley VCH Verlag, Weinheim, Germany (2012)
4363.
Buch
Alkauskas, A.; Deak, P.; Neugebauer, J.; Pasquarello, A.; van de Walle, C. G. (Hg.): Advanced Calculations for Defects in Materials: Electronic Structure Methods. WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany (2011), 384 S.
4364.
Buch
Race, C. P.: The Modelling of Radiation Damage in Metals Using Ehrenfest Dynamics. Springer-Verlag Berlin / Heidelberg, Germany (2010), 303 S.
4365.
Buch
Roters, F.; Eisenlohr, P.; Bieler, T. R.; Raabe, D.: Crystal Plasticity Finite Element Methods in Materials Science and Engineering. Wiley-VCH, Weinheim (2010), 197 S.
4366.
Buch
Boeck, S.: Development and Application of the S/PHI/nX Library. Südwestdeutscher Verlag für Hochschulschriften, Saarbrücken, Germany (2009), 164 S.
4367.
Buch
Mudali, U. K.; Rai, B.: Corrosion Science and Technology: Mechanism, Mitigation and Monitoring. CRC; 1 edition (November 20, 2008) (2008), 586 pages S.
4368.
Buch
Hassel, A. W.; Bonk, S.; Wicinski, M.; Stratmann, M.; Ogle, K.; Philips-Falcey, N.; Ostwald, C.; Janssen, S.; Stellnberger, K.-H.; Konrath, P.: Passive/active transistions in cyclic corrosion tests. Office for Official Publications of the European Communities, Luxembourg, Luxembourg (2007)
4369.
Buch
Janssens, K. G. F.; Raabe, D.; Kozeschnik, E.; Miodownik, M. A.; Nestler, B.: Computational Materials Engineering – An Introduction to Microstructure Evolution. Academic Press, Elsevier, USA (2007), 360 S.
4370.
Buch
Winning, M.: Korngrenzen auf Wanderschaft – Wege zum Design metallischer Werkstoffe. Franz Steiner Verlag, Stuttgart [Germany] (2007), 34 S.
4371.
Buch
Hildebrandt, S.; Lymperakis, L.; Neugebauer, J.; Stutzmann, M. (Hg.): Proceedings of the 6th International Conference of Nitride Semiconductors. Wiley-VCH - physica status solidi, Weinheim, Germany (2006), 203 S.
4372.
Buch
Raabe, D.; Roters, F.; Barlat, F.; Chen, L.-Q. (Hg.): Continuum Scale Simulation of Engineering Materials Fundamentals - Microstructures - Process Applications. WILEY-VCH, Weinheim (2004), 855 S.
4373.
Buch
Bard, A. J.; Stratmann, M. (Hg.): Encyclopaedia of Electrochemistry. Wiley-VCh, Weinheim, Germany (2003), 10 Volumes S.
4374.
Buch
Bard, A. J.; Stratmann, M. (Hg.): Bard-Stratmann: Encyclopaedia of Electrochemistry. (2003)
4375.
Buch
Bard, A. J.; Stratmann, M. (Hg.): Bard-Stratmann: Encyclopaedia of Electrochemistry. (2003)
4376.
Buch
Bard, A. J.; Stratmann, M. (Hg.): Bard-Stratmann: Encyclopaedia of Electrochemistry. (2003)
4377.
Buch
Bard, A. J.; Stratmann, M. (Hg.): Bard-Stratmann: Encyclopaedia of Electrochemistry. (2003)
4378.
Buch
Bard, A. J.; Stratmann, M. (Hg.): Bard-Stratmann: Encyclopaedia of Electrochemistry. (2003)
4379.
Buch
Bard, A. J.; Stratmann, M. (Hg.): Bard-Stratmann: Encyclopaedia of Electrochemistry. (2003)
4380.
Buch
Bard, A. J.; Stratmann, M. (Hg.): Bard-Stratmann: Encyclopaedia of Electrochemistry. (2003)
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