Publikationen von Thomas Schöberl

Völker, B.; Heinz, W.; Matoy, K.; Roth, R.; Batke, J. M.; Schöberl, T.; Cordill, M. J.; Dehm, G.: Mechanical and chemical investigation of the interface between tungsten-based metallizations and annealed borophosphosilicate glass. Thin Solid Films 583, S. 170 - 176 (2015)

Völker, B.; Heinz, W.; Matoy, K.; Roth, R.; Batke, J. M.; Schöberl, T.; Scheu, C.; Dehm, G.: Interface fracture and chemistry of a tungsten-based metallization on borophosphosilicate glass. Philosophical Magazine 95 (16-18), S. 1967 - 1981 (2015)

Matoy, K.; Schönherr, H.; Detzel, T.; Schöberl, T.; Pippan, R.; Motz, C.; Dehm, G.: A comparative micro-cantilever study of the mechanical behavior of silicon based passivation films. Thin Solid Films 518 (1), S. 247 - 256 (2009)

Guidoni, G. M.; He, L.; Schöberl, T.; Jäger, I.; Dehm, G.; Swain, M. V.: Influence of the indenter tip geometry and environment on the indentation modulus of enamel. Journal of Materials Research 24 (3), S. 616 - 625 (2009)

Kiener, D.; Motz, C.; Schöberl, T.; Jenko, M.; Dehm, G.: Determination of mechanical properties of copper at the micron scale. Advanced Engineering Materials 8 (11), S. 1119 - 1125 (2006)

Motz, C.; Kiener, D.; Schöberl, T.; Pippan, R.; Dehm, G.: Sekundärionen-Massenspektroskopie (SIMS) mittels FIB. In: Handbuch der Nanoanalytik Steiermark, NanoNet Styria, 1 Aufl., S. 1 - 311 (Hg. Rom, W.). W. Rom, Graz, Austria (2005)

Motz, C.; Kiener, D.; Schöberl, T.; Pippan, R.; Dehm, G.: Fokussierte Ionenstrahl-Technik (FIB) in der Mikro- und Nanomechanik. In: Handbuch der Nanoanalytik Steiermark, NanoNet Styria, 1 Aufl., S. 1 - 311 (Hg. Rom, W.). W. Rom, Graz, Austria (2005)

Motz, C.; Kiener, D.; Schöberl, T.; Dehm, G.: Micron beam bending and compression tests - micromechanical properties of copper. 7th European Symposium on nano-mechanical testing, Hückelhoven, Germany (2006)