Publikationen von Stefan Werner Hieke

Hieke, S. W.; Frank, A.; Duarte, M. J.; Gopalan, H.; Patil, P.; Wetegrove, M.; Rohloff, M.; Kruth, A.; Pistidda, C.; Dornheim, M. et al.; Taube, K.; Dehm, G.; Scheu, C.: Stability and Failure Mechanisms of Al₂O₃|Al Bilayer Coatings Exposed to 300 Bar Hydrogen at 673 K. Advanced Engineering Materials, 2300619 (2023)

Frank, A.; Dias, M.; Hieke, S. W.; Kruth, A.; Scheu, C.: Spontaneous fluctuations in a plasma ion assisted deposition – correlation between deposition conditions and vanadium oxide thin film growth. Thin Solid Films 722, 138574 (2021)

Frank, A.; Gänsler, T.; Hieke, S. W.; Fleischmann, S.; Husmann, S.; Presser, V.; Scheu, C.: Structural and chemical characterization of MoO₂/MoS₂ triple-hybrid materials using electron microscopy in up to three dimensions. Nanoscale Advances (3), S. 1067 - 1076 (2021)

Fleischmann, S.; Dörr, T. S.; Frank, A.; Hieke, S. W.; Doblas-Jimenez, D.; Scheu, C.; de Oliveira, P. W.; Kraus, T.; Presser, V.: Gyroidal Niobium Sulfide/Carbon Hybrid Monoliths for Electrochemical Energy Storage. Batteries & Supercaps 2 (8), S. 668 - 672 (2019)

Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Chatain, D.; Dehm, G.; Scheu, C.: On pinning-depinning and microkink-flow in solid state dewetting: Insights by in-situ ESEM on Al thin films. Acta Materialia 165, S. 153 - 163 (2019)

Budak, Ö.; Srimuk, P.; Tolosa, A.; Fleischmann, S.; Lee, J.; Hieke, S. W.; Frank, A.; Scheu, C.; Presser, V.: Vanadium (III) Oxide/Carbon Core/Shell Hybrids as an Anode for Lithium‐Ion Batteries. Batteries & Supercaps 2 (1), S. 74 - 82 (2019)

Hieke, S. W.; Dehm, G.; Scheu, C.: Annealing induced void formation in epitaxial Al thin films on sapphire (α-Al₂O₃). Acta Materialia 140, S. 355 - 365 (2017)

Toparli, C.; Hieke, S. W.; Altin, A.; Kasian, O.; Scheu, C.; Erbe, A.: State of the Surface of Antibacterial Copper in Phosphate Buffered Saline. Journal of the Electrochemical Society 164 (12), S. H734 - H742 (2017)

Hieke, S. W.; Breitbach, B.; Dehm, G.; Scheu, C.: Microstructural evolution and solid state dewetting of epitaxial Al thin films on sapphire (α-Al₂O₃). Acta Materialia 133, S. 356 - 366 (2017)

Raghavan, R.; Harzer, T. P.; Djaziri, S.; Hieke, S. W.; Kirchlechner, C.; Dehm, G.: Maintaining strength in supersaturated copper–chromium thin films annealed at 0.5 of the melting temperature of Cu. Journal of Materials Science 52 (2), S. 913 - 920 (2017)

Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Dehm, G.; Scheu, C.: In situ electron microscopy – insights in solid state dewetting of epitaxial Al thin films on sapphire. In: Microscopy Conference 2017 (MC 2017) - Proceedings (Hg. Laue, M.). Microscopy Conference 2017 (MC 2017), Lausanne, Switzerland, 21. August 2017 - 25. August 2017. Universität Regensburg, Regensburg (2017)

Hieke, S. W.; Dehm, G.; Scheu, C.: Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy. In: European Microscopy Congress 2016: Proceedings, S. 203 - 204. The 16th European Microscopy Congress (EMC 2016), Lyon, France, 28. August 2016 - 02. September 2016. Wiley-VCH Verlag GmbH & Co KGaA (2016)

Scheu, C.; Hieke, S. W.: How stable are thin Aluminium films: Dewetting phenomena observed by in-situ electron microscopy. Microscopy Conference 2019 (MC2019), Berlin, Germany (2019)

Scheu, C.; Hieke, S. W.: Fundamentals and Applications of Electron Energy-Loss Spectroscopy in a Scanning Transmission Electron Microscope. Universita' Roma Tre Colloquium, Roma, Italy (2019)

Frank, A.; Dias, M.; Hieke, S. W.; Kruth, A.; Scheu, C.: Electron microscopic investigation of the influence of plasma parameters on VOx films deposited by a plasma ion assisted process. E-MRS 2019 Spring Meeting, Nice, France (2019)

Frank, A.; Hieke, S. W.; Dias, M.; Fleischmann, S.; Presser, V.; Kruth, A.; Scheu, C.: Transmission electron microscopy study of carbon/metal oxide hybrid materials for Energy Storage Application. 19th International Microscopy Congress IMC19, Sydney, Australia (2018)

Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Dehm, G.; Scheu, C.: Evolution of faceted voids and fingering instabilities in a model thin film system - Insights by in-situ environmental scanning electron microscopy. Symposium - In situ Microscopy with Electrons, X‐rays and Scanning Probes, Universität Erlangen‐Nürnberg, Erlangen, Germany (2017)

Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Dehm, G.; Scheu, C.: In-situ electron microscopy: Insights in solid state dewetting of epitaxial Al thin films on sapphire. 13th Multinational Congress on Microscopy, Rovinj, Croatia (2017)

Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Dehm, G.; Scheu, C.: In-situ electron microscopy: Insights in solid state dewetting of epitaxial Al thin films on sapphire. Microscopy Conference 2017 – Dreiländertagung (MC 2017), Lausanne, Switzerland (2017)

Hieke, S. W.; Dehm, G.; Scheu, C.: Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy. The 16th European Microscopy Congress (EMC 2016), Lyon, France (2016)