Publikationen von Frédéric Danoix

Jenkins, B. M.; Danoix, F.; Gouné, M.; Bagot, P. A. J.; Peng, Z.; Moody, M. P.; Gault, B.: Reflections on the Analysis of Interfaces and Grain Boundaries by Atom Probe Tomography. Microscopy and Microanalysis 26 (2), S. 247 - 257 (2020)