Publikationen von Manfred Rühle

Scheu, C.; Gao, M.; Oh, S. H.; Dehm, G.; Klein, S.; Tomsia, A.; Rühle, M.: Bonding at copper-alumina interfaces established by different surface treatments: a critical review. Journal of Materials Science 41 (16), S. 5161 - 5168 (2006)

Scheu, C.; Dehm, G.; Rühle, M.; Brydson, R.: Electron-energy-loss spectroscopy studies of Cu-α-Al₂O₃ interfaces grown by molecular beam epitaxy. Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties 78 (2), S. 439 - 465 (1998)

Dehm, G.; Scheu, C.; Rühle, M.; Raj, R.: Growth and Structure of Internal Cu/Al₂O₃ and Cu/Ti/Al₂O3 Interfaces. Acta Materialia 46 (3), S. 759 - 772 (1998)

Gaudette, F. G.; Süresh, S.; Evans, A. G.; Dehm, G.; Rühle, M.: The Influence of Chromium Addition on the Toughness of γ-Ni/α-Al₂O₃ Interfaces. Acta Materialia 45 (9), S. 3503 - 3513 (1997)

Dehm, G.; Scheu, C.; Möbus, G.; Brydson, R.; Rühle, M.: Synthesis of Analytical and High Resolution Transmission Electron Microscopy to Determine the Interface Structure of Cu/Al₂O₃. Ultramicroscopy 67 (1-4), S. 207 - 217 (1997)

Dehm, G.; Rühle, M.; Conway, H. D.; Raj, R.: A microindentation method for estimating interfacial shear strength and its use in studying the influence of titanium transition layers on the interface strength of epitaxial copper films on sapphire. Acta Materialia 45 (2), S. 489 - 499 (1997)

Dehm, G.; Ernst, F.; Mayer, J.; Möbus, G.; Müllejans, H.; Phillipp, F.; Scheu, C.; Rühle, M.: Transmission Electron Microscopy at the Max-Planck-Institut für Metallforschung. Zeitschrift für Metallkunde 87 (11), S. 898 - 910 (1996)

Dehm, G.; Nadarzinski, K.; Ernst, F.; Rühle, M.: Quantification of Irradiation Damage Generated During HRTEM with 1250keV Electrons. Ultramicroscopy 63 (1), S. 49 - 55 (1996)

Dehm, G.; Scheu, C.; Raj, R.; Rühle, M.: Growth, structure and interfaces of Cu and Cu/Ti thin films on (0001)alpha-Al₂O₃. Materials Science Forum 207-209 (1), S. 217 - 220 (1996)

Dehm, G.; Raj, R.; Rühle, M.: Influence of Interfacial Layers on the Ultimate Shear Strength of Copper/Sapphire Interfaces. Materials Science Forum 207-209 (2), S. 597 - 600 (1996)

Scheu, C.; Dehm, G.; Müllejans, H.; Rühle, M.: Electron Energy-Loss Spectroscopy at Cu/Al₂O₃ and Ti/Al₂O₃ Interfaces. Materials Science Forum 207-209 (1), S. 181 - 184 (1996)

Möbus, G.; Schumann, E.; Dehm, G.; Rühle, M.: Measurement of Coherency States of Metal-Ceramic Interfaces by HRTEM Image Processing. Physica Status Solidi A 150 (1), S. 77 - 87 (1995)

Dehm, G.; Rühle, M.; Ding, G.; Raj, R.: Growth and Structure of Copper Thin Films Deposited on (0001) Sapphire by Molecular Beam Epitaxy. Philosophical Magazine B-Physics of Condensed Matter Statistical Mechanics Electronic Optical and Magnetic Properties 71 (6), S. 1111 - 1124 (1995)

Scheu, C.; Dehm, G.; Müllejans, H.; Brydson, R.; Rühle, M.: Electron Energy-Loss Near-Edge Structure of Metal-Alumina Interfaces. Microscopy Microanalysis Microstructures 6 (1), S. 19 - 31 (1995)

Dehm, G.; Raj, R.; Rühle, M.: Measurement of the Interfacial Shear Strength of Thin Copper Films on Sapphire by Microindentation Experiments. In: Materials Research Symposium Proceedings 1996 (Symposium I – Polycrystalline Thin Films: Structure, Texture, Properties and Applications II), Bd. 403, S. 151 - 156. 1996 MRS Fall Meeting & Exhibit, Boston, MA, USA, 02. Dezember 1996 - 06. Dezember 1996. Materials Research Society, Boston, MA, USA (2011)

Oh, S. H.; Scheu, C.; Dehm, G.; Wagner, T. A.; Rühle, M.; Lee, H. J.: Direct atomic scale observation of dynamic alumina-aluminum solid-liquid interfaces. In: The 8th Asia-Pacific Conference on Electron Microscopy (8APEM): In Conjunction with the 60th Annual Meeting of the Japanese Society of Microscopy, S. 671 - 672. 8th Asia-Pacific Conference on Electron Microscopy (8APEM), Kanazawa, Japan, 07. Juni 2004 - 11. Juni 2004. Die Japanische Gesellschaft für Mikroskopie, Uchinada-mati (Isikawa-ken), Japan (2004)

Dehm, G.; Scheu, C.; Rühle, M.: Interface Structure of Epitaxial Cu Films on (0001) α-Al₂O₃. In: Proceedings of the 14th ICEM, Bd. 2, S. 567 - 568. 11th International Congress on Electron Microscopy, Dublin, Ireland, 26. August 1996 - 30. August 1996. (1998)

Rühle, M.; Dehm, G.; Scheu, C.: Structure and Composition of Interfaces in Ceramics and Ceramic Composites. In: Proc. of the International Materials Symposium on Ceramic Microstructures: Controll at the Atomic Level, S. 1 - 12 (Hg. Tomsia, A. P.; Glaeser, A.). International Materials Symposium on Ceramic Microstructures: Controll at the Atomic Level, Berkley, CA, USA, 24. Juni 1996 - 27. Juni 1996. Plenum Press, New York (1998)

Möbus, G.; Dehm, G.; Gutekunst, G.; Rühle, M.: Problems in Interpreting Sub-Å-Resolution Images Studied by Simulated Evolution Based Digital Image Matching. In: MSA 1995: Proceedings Microscopy and Analysis 1995, S. 638 - 639. Microscopy Society of America, 53rd Meeting, Kansas City, MO, USA, 13. August 1995 - 17. August 1995. Microscopy Society of America, USA (1995)

Dehm, G.; Rühle, M.; Ding, G.; Raj, R.: Structure of Copper/Sapphire Interfaces. In: Electron Microscopy 1994: Proceedings of the 13th International Congress on Electron Microscopy, Applications in Materials Sciences, Bd. 2A-2B, S. 277 - 278 (Hg. Jouffrey, B.). 13th International Congress on Electron Microscopy , Paris, France, 17. Juli 1994 - 22. Juli 1994. Les Editions de Physique; 1994 (1994)