Publikationen von Baptiste Gault

Hatipoglu, E.; Saksena, A.; Michael Schneider, J.; Gault, B.; El-Zoka, A.: Development of Thin-Film Nanoporous Ruthenium Electrocatalysts Using Atom Probe Tomography. 245th The Electrochemical Scoiety (ECS) Meeting, San Francisco, CL, USA (2024)

Li, Y.; Gault, B.: Machine learning-enabled tomographic imaging of chemical short-range ordering in CoCrNi alloy. TMS 2023, San Diego, CA, USA (2024)

Li, Y.; Gault, B.: Machine Learning-enabled Tomographic Imaging of Chemical Short-range Order in Fe-based Solid-solutions. DPG 2024, Berlin, Germany (2024)

Li, Y.; Gault, B.: Machine Learning-enabled Tomographic Imaging of Chemical Short-range Order in Fe-based Solid-solutions. TMS 2024, Orlando, FL, USA (2024)

Zhou, X.; Ahmadian, A.; Hickel, T.; Gault, B.; Ophus, C.; Liebscher, C.; Dehm, G.; Raabe, D.: Atomic Scale Analysis Reveals the Interplay between Grain Boundary Structure and Composition. MRS 2023, Boston, MA, USA (2023)

Woods, E.; Aota, L. S.; Schwarz, T.; Kim, S.-H.; Douglas, J. O.; Singh, M. P.; Gault, B.: In-situ cryogenic protective layers and metal coatings in cryogenic FIB. IMC20 - 20th International Microscopy Congress - Pre-congress workshop, Cryogenic Atom Probe Tomography, Busan, South Korea (2023)

Hatipoglu, E.; Saksena, A.; Michael Schneider, J.; Gault, B.; El-Zoka, A.: Probing Dealloying Mechanisms in Thin-Film Nanoporous Metals Using Atom Probe Tomography. Atom Probe Tomography & Microscopy, Leuven, Belgium (2023)

Li, Y.; Gault, B.: Machine learning-enabled tomographic imaging of chemical short-range ordering in CoCrNi alloys. APT&M 2023, Leuven, Belgium (2023)

Saksena, A.; Sun, B.; Dong, X.; Khanchandani, H.; Gault, B.: Visualizing radiation-induced damage by Hydrogen/Deuterium. APT&M, Frankfurt, Germany (2023)

Woods, E.; Aota, L. S.; Schwarz, T.; Singh, M. P.; Zhang, S.; Douglas, J.; Gault, B.: Site-specific preparation and atom probe tomography of bulk water ice and amino acid solutions. Atom Probe Tomography & Microscopy, Leuven, Belgium (2023)

Nallathambi, V.; Wang, C.; Reichenberger, S.; Gault, B.; Eychmüller, A.; Barcikowski, S.; Raabe, D.: Identifying multielement active sites as a design strategy for high-performance laser-generated H₂O₂ electrocatalysts. Atom Probe Tomography & Microscopy conference, Leuven, Belgium (2023)

Zhang, S.; Kim, S.-H.; Mingers, A. M.; Gault, B.; Scheu, C.: Operando Study on the activation of hydrogen evolution electrocatalysts. NRF-DFG meeting “Electrodes for direct sea-water splitting and microstructure based stability analyses”, Korean Institute for Energy Research, Daejeon, South Korea (2023)

Woods, E.; Aota, L. S.; Schwarz, T.; Singh, M. P.; Zhang, S.; Douglas, J. O.; Gault, B.: Site-specific preparation and atom probe tomography of frozen liquids. IMC20 - 20th International Microscopy Congress, Busan, South Korea (2023)

Woods, E.; Aota, L. S.; El-Zoka, A.; Kim, S.-H.; Douglas, J. O.; Singh, M. P.; Schwarz, T.; Gault, B.: GIS-free metal coating in cryo-FIB: methods and use cases. IMC20 - 20th International Microscopy Congress, Busan, South Korea (2023)

Zhang, S.; Kim, S.-H.; Mingers, A. M.; Gault, B.; Scheu, C.: Operando Study on the corrosion of photo-electrocatalysts. NRF-DFG meeting “Electrodes for direct sea-water splitting and microstructure based stability analyses”, Kangwon National University, Chuncheon-si, South Korea (2023)

Zhou, X.; Bai, Y.; Kim, S.-H.; Ma, Y.; Liebscher, C.; Gault, B.; Rezaei Mianroodi, J.; Dehm, G.; Raabe, D.: The chemical, thermodynamic and kinetic roles of pores in the hydrogen-based direct reduction of single-crystalline wüstite into iron. EUROMAT 2023, Frankfurt, Germany (2023)

Saksena, A.; Sun, B.; Dong, X.; Khanchandani, H.; Ponge, D.; Raabe, D.; Gault, B.: Interaction of Hydrogen/ Deuterium with defects in two-phase steels. FEMS EUROMAT, Frankfurt, Germany (2023)

Best, J. P.; Dubosq, R.; Gault, B.: New perspectives for in situ nanomechanics at cryogenic temperatures. FEMS EUROMAT 2023, Frankfurt, Germany (2023)

Dehm, G.; Langenohl, L.; Ahmad, S.; Ahmadian, A.; Frolov, T.; Duarte, M. J.; Richter, G.; Zhou, X.; Gault, B.; Bishara, H. et al.; Brink, T.; Liebscher, C.: Resolving grain boundary complexions in Copper by STEM and analyzing their impact on properties. Workshop Advanced Electron Microscopy in Materials Research, La Clusaz, France (2023)

Ferraz Morgado, F.; Bhatt, S.; Stephenson, L.; Mouton, I.; Neugebauer, J.; Raabe, D.; Freysoldt, C.; Gault, B.; Katnagallu, S.: Experiment and Simulation Advances for atomic scale characterization using analytical field ion microscopy. Microscopy & Microanalysis 2023 (M&M 2023), Minneapolis, MN, USA (2023)