Publikationen von Rishi Raj

Dehm, G.; Scheu, C.; Rühle, M.; Raj, R.: Growth and Structure of Internal Cu/Al₂O₃ and Cu/Ti/Al₂O3 Interfaces. Acta Materialia 46 (3), S. 759 - 772 (1998)

Dehm, G.; Rühle, M.; Conway, H. D.; Raj, R.: A microindentation method for estimating interfacial shear strength and its use in studying the influence of titanium transition layers on the interface strength of epitaxial copper films on sapphire. Acta Materialia 45 (2), S. 489 - 499 (1997)

Dehm, G.; Scheu, C.; Raj, R.; Rühle, M.: Growth, structure and interfaces of Cu and Cu/Ti thin films on (0001)alpha-Al₂O₃. Materials Science Forum 207-209 (1), S. 217 - 220 (1996)

Dehm, G.; Raj, R.; Rühle, M.: Influence of Interfacial Layers on the Ultimate Shear Strength of Copper/Sapphire Interfaces. Materials Science Forum 207-209 (2), S. 597 - 600 (1996)

Dehm, G.; Rühle, M.; Ding, G.; Raj, R.: Growth and Structure of Copper Thin Films Deposited on (0001) Sapphire by Molecular Beam Epitaxy. Philosophical Magazine B-Physics of Condensed Matter Statistical Mechanics Electronic Optical and Magnetic Properties 71 (6), S. 1111 - 1124 (1995)

Dehm, G.; Raj, R.; Rühle, M.: Measurement of the Interfacial Shear Strength of Thin Copper Films on Sapphire by Microindentation Experiments. In: Materials Research Symposium Proceedings 1996 (Symposium I – Polycrystalline Thin Films: Structure, Texture, Properties and Applications II), Bd. 403, S. 151 - 156. 1996 MRS Fall Meeting & Exhibit, Boston, MA, USA, 02. Dezember 1996 - 06. Dezember 1996. Materials Research Society, Boston, MA, USA (2011)

Dehm, G.; Rühle, M.; Ding, G.; Raj, R.: Structure of Copper/Sapphire Interfaces. In: Electron Microscopy 1994: Proceedings of the 13th International Congress on Electron Microscopy, Applications in Materials Sciences, Bd. 2A-2B, S. 277 - 278 (Hg. Jouffrey, B.). 13th International Congress on Electron Microscopy , Paris, France, 17. Juli 1994 - 22. Juli 1994. Les Editions de Physique; 1994 (1994)