Publikationen von Shyam Katnagallu

Morgado, F. F.; Katnagallu, S.; Freysoldt, C.; Klaes, B.; Vurpillot, F.; Neugebauer, J.; Raabe, D.; Neumeier, S.; Gault, B.; Stephenson, L.: Revealing atomic-scale vacancy-solute interaction in nickel. Scripta Materialia 203, 114036 (2021)

Morgado, F. F.; Katnagallu, S.; Freysoldt, C.; Klaes, B.; Vurpillot, F.; Neugebauer, J.; Raabe, D.; Neumeier, S.; Gault, B.; Stephenson, L.: Corrigendum to Revealing atomic-scale vacancy-solute interaction in nickel (Scripta Materialia (2021) 203, (114036) (S135964622100316X), (10.1016/j.scriptamat.2021.114036)). Scripta Materialia 205, 114213 (2021)

Klaes, B.; Lardé, R.; Delaroche, F.; Parviainen, S.; Rolland, N.; Katnagallu, S.; Gault, B.; Vurpillot, F.: A model to predict image formation in the three-dimensional field ion microscope. Computer Physics Communications 260, 107317 (2021)

Katnagallu, S.; Vernier, S.; Charpagne, M.-A.; Gault, B.; Bozzolo, N.; Kontis, P.: Nucleation mechanism of hetero-epitaxial recrystallization in wrought nickel-based superalloys. Scripta Materialia 191, S. 7 - 11 (2021)

Mantha, L. S.; MacDonald, B. E.; Mu, X.; Mazilkin, A.; Ivanisenko, J.; Hahn, H.; Lavernia, E. J.; Katnagallu, S.; Kübel, C.: Grain boundary segregation induced precipitation in a non equiatomic nanocrystalline CoCuFeMnNi compositionally complex alloy. Acta Materialia 220, 117281 (2021)

Raabe, D.; Sun, B.; Kwiatkowski da Silva, A.; Gault, B.; Yen, H.-W.; Sedighiani, K.; Thoudden Sukumar, P.; Souza Filho, I. R.; Katnagallu, S.; Jägle, E. A. et al.; Kürnsteiner, P.; Kusampudi, N.; Stephenson, L.; Herbig, M.; Liebscher, C.; Springer, H.; Zaefferer, S.; Shah, V.; Wong, S. L.; Baron, C.; Diehl, M.; Roters, F.; Ponge, D.: Current Challenges and Opportunities in Microstructure-Related Properties of Advanced High-Strength Steels. Metallurgical and Materials Transactions A 51, S. 5517 - 5586 (2020)

Gomell, L.; Katnagallu, S.; Diack-Rasselio, A.; Maier, S.; Perrière, L.; Scheu, C.; Alleno, E.; Gault, B.: Chemical segregation and precipitation at anti-phase boundaries in thermoelectric Heusler-Fe₂VAl. Scripta Materialia 186, S. 370 - 374 (2020)

Katnagallu, S.; Wu, G.; Singh, S. P.; Nandam, S. H.; Xia, W.; Stephenson, L.; Gleiter, H.; Schwaiger, R.; Hahn, H.; Herbig, M. et al.; Raabe, D.; Gault, B.; Balachandran, S.: Nanoglass–Nanocrystal Composite - a Novel Material Class for Enhanced Strength-Plasticity Synergy. Small 16 (39), 2004400 (2020)

Katnagallu, S.; Stephenson, L.; Mouton, I.; Freysoldt, C.; Subramanyam, A. P. A.; Jenke, J.; Ladines, A. N. C.; Neumeier, S.; Hammerschmidt, T.; Drautz, R. et al.; Neugebauer, J.; Vurpillot, F.; Raabe, D.; Gault, B.: Imaging individual solute atoms at crystalline imperfections in metals. New Journal of Physics 21 (12), 123020 (2019)

Mouton, I.; Katnagallu, S.; Makineni, S. K.; Cojocaru-Mirédin, O.; Schwarz, T.; Stephenson, L.; Raabe, D.; Gault, B.: Calibration of Atom Probe Tomography Reconstructions Through Correlation with Electron Micrographs. Microscopy and Microanalysis 25 (2), S. 301 - 308 (2019)

Katnagallu, S.; Dagan, M.; Parviainen, S.; Nematollahi, G. A.; Grabowski, B.; Bagot, P. A. J.; Rolland, N.; Neugebauer, J.; Raabe, D.; Vurpillot, F. et al.; Moody, M. P.; Gault, B.: Impact of local electrostatic field rearrangement on field ionization. Journal of Physics D: Applied Physics 51 (10), 105601, S. 1 - 10 (2018)

Katnagallu, S.; Gault, B.; Grabowski, B.; Neugebauer, J.; Raabe, D.; Nematollahi, G. A.: Advanced data mining in field ion microscopy. Materials Characterization, S. 1 - 12 (2018)

Katnagallu, S.; Nematollahi, G. A.; Dagan, M.; Moody, M. P.; Grabowski, B.; Gault, B.; Raabe, D.; Neugebauer, J.: High Fidelity Reconstruction of Experimental Field Ion Microscopy Data by Atomic Relaxation Simulations. In: Proceedings of Microscopy & Microanaalysis 2017, Bd. 23, S. 642 - 643. Microscopy and Microanalysis 2017, St. Louis, MO, USA, 06. August 2017 - 10. August 2017. Cambridge University Press, New York, NY, USA (2017)

Parviainen, S.; Dagan, M.; Katnagallu, S.; Gault, B.; Moody, M. P.; Vurpillot, F.: Atomistic Simulations of Surface Effects Under High Electric Fields. In: Proceedings of Microscopy & Microanalysis 2017, Bd. 23, S. 644 - 645. Microscopy & Microanalysis 2017, St. Louis, Missouri, USA, 06. August 2017 - 10. August 2017. (2017)

Raabe, D.; Ponge, D.; Kwiatkowski da Silva, A.; Makineni, S. K.; Katnagallu, S.; Zhou, X.; Kamachali, R. D.; Stephenson, L.; Kontis, P.; Mianroodi, J. R. et al.; Gault, B.; Thompson, G. B.; Neugebauer, J.: Structure, chemistry and thermodynamics of Lattice Defects. Colloquium of the Department of Materials Science and Engineering, Ohio State Universitry, online, Columbus, OH, USA (2021)

Kontis, P.; Antonov, S.; Kürnsteiner, P.; Katnagallu, S.; Mianroodi, J. R.; Lilensten, L.: Development of superalloys driven by atomic-scale interactions of solutes with crystal defects. TMS 2021 Annual Meeting & Exhibition, online, Pittsburgh, PA, USA (2021)

Ponge, D.; Kwiatkowski da Silva, A.; Makineni, S. K.; Katnagallu, S.; Zhou, X.; Mianroodi, J. R.; Stephenson, L.; Kontis, P.; Freysoldt, C.; Gault, B. et al.; Neugebauer, J.: Chemistry and Structure at Lattice Defects studied at the Atomic Scale. 4th Symposium Core Research Cluster Materials Science & 3rd Symposium on International Joint Graduate Program in Materials Science, Tohoku University, online, Tohoku, Japan (2020)

Raabe, D.; Ponge, D.; Kwiatkowski da Silva, A.; Makineni, S. K.; Katnagallu, S.; Stephenson, L.; Kontis, P.; Freysoldt, C.; Neugebauer, J.; Gault, B.: Chemistry at Lattice Defects Probed at Atomic Scale. 20th International Union of Materials Research Societies International Conference in Asia IUMRS, Perth, Australia (2019)

Stephenson, L.; Katnagallu, S.; Mouton, I.; Oliveira, F.; Gault, B.; Raabe, D.: An Atomic Renaissance for Pulsed Field Ion Microscopy. Microscopy & Microanalysis 2019, Portland, OR, USA (2019)

Raabe, D.; Ponge, D.; Kwiatkowski da Silva, A.; Makineni, S. K.; Katnagallu, S.; Stephenson, L.; Kontis, P.; Wu, X.; Freysoldt, C.; Neugebauer, J. et al.; Gault, B.: Chemistry at Lattice Defects Probed at Atomic Scale. The 53rd Annual Meeting of the Israel Society for Microscopy, Tel Aviv, Israel, Tel Aviv, Israel (2019)