Suchergebnisse

Gomell, L.; Katnagallu, S.; Diack-Rasselio, A.; Maier, S.; Perrière, L.; Scheu, C.; Alleno, E.; Gault, B.: Chemical segregation and precipitation at anti-phase boundaries in thermoelectric Heusler-Fe₂VAl. Scripta Materialia 186, S. 370 - 374 (2020)

Katnagallu, S.; Stephenson, L.; Mouton, I.; Freysoldt, C.; Subramanyam, A. P. A.; Jenke, J.; Ladines, A. N. C.; Neumeier, S.; Hammerschmidt, T.; Drautz, R. et al.; Neugebauer, J.; Vurpillot, F.; Raabe, D.; Gault, B.: Imaging individual solute atoms at crystalline imperfections in metals. New Journal of Physics 21 (12), 123020 (2019)

Mouton, I.; Katnagallu, S.; Makineni, S. K.; Cojocaru-Mirédin, O.; Schwarz, T.; Stephenson, L.; Raabe, D.; Gault, B.: Calibration of Atom Probe Tomography Reconstructions Through Correlation with Electron Micrographs. Microscopy and Microanalysis 25 (2), S. 301 - 308 (2019)

Katnagallu, S.; Dagan, M.; Parviainen, S.; Nematollahi, G. A.; Grabowski, B.; Bagot, P. A. J.; Rolland, N.; Neugebauer, J.; Raabe, D.; Vurpillot, F. et al.; Moody, M. P.; Gault, B.: Impact of local electrostatic field rearrangement on field ionization. Journal of Physics D: Applied Physics 51 (10), 105601, S. 1 - 10 (2018)

Katnagallu, S.; Gault, B.; Grabowski, B.; Neugebauer, J.; Raabe, D.; Nematollahi, G. A.: Advanced data mining in field ion microscopy. Materials Characterization, S. 1 - 12 (2018)

Katnagallu, S.; Nematollahi, G. A.; Dagan, M.; Moody, M. P.; Grabowski, B.; Gault, B.; Raabe, D.; Neugebauer, J.: High Fidelity Reconstruction of Experimental Field Ion Microscopy Data by Atomic Relaxation Simulations. In: Proceedings of Microscopy & Microanaalysis 2017, Bd. 23, S. 642 - 643. Microscopy and Microanalysis 2017, St. Louis, MO, USA, 06. August 2017 - 10. August 2017. Cambridge University Press, New York, NY, USA (2017)

Parviainen, S.; Dagan, M.; Katnagallu, S.; Gault, B.; Moody, M. P.; Vurpillot, F.: Atomistic Simulations of Surface Effects Under High Electric Fields. In: Proceedings of Microscopy & Microanalysis 2017, Bd. 23, S. 644 - 645. Microscopy & Microanalysis 2017, St. Louis, Missouri, USA, 06. August 2017 - 10. August 2017. (2017)

Raabe, D.; Ponge, D.; Kwiatkowski da Silva, A.; Makineni, S. K.; Katnagallu, S.; Stephenson, L.; Kontis, P.; Freysoldt, C.; Neugebauer, J.; Gault, B.: Chemistry at Lattice Defects Probed at Atomic Scale. 20th International Union of Materials Research Societies International Conference in Asia IUMRS, Perth, Australia (2019)

Raabe, D.; Ponge, D.; Kwiatkowski da Silva, A.; Makineni, S. K.; Katnagallu, S.; Stephenson, L.; Kontis, P.; Wu, X.; Freysoldt, C.; Neugebauer, J. et al.; Gault, B.: Chemistry at Lattice Defects Probed at Atomic Scale. The 53rd Annual Meeting of the Israel Society for Microscopy, Tel Aviv, Israel, Tel Aviv, Israel (2019)

Raabe, D.; Ponge, D.; Kwiatkowski da Silva, A.; Makineni, S. K.; Katnagallu, S.; Stephenson, L.; Kontis, P.; Wu, X.; Freysoldt, C.; Neugebauer, J. et al.; Gault, B.: Interaction of Chemistry and Structure at Lattice Defects at Atomic Scale. Russell Berrie Nanotechnology Institute, Technion, Haifa, Israel, Haifa, Israel (2019)

Raabe, D.; Katnagallu, S.; Stephenson, L.; Balachandran, S.; Freysoldt, C.; Neugebauer, J.; Gault, B.: Imaging single vacancies and atoms using joint FIM and APT experiments. Conference on Possibilities and Limitations of Quantitative Materials Modeling and Characterization, Bernkastel-Kues, Germany (2019)

Raabe, D.; Ponge, D.; Kwiatkowski da Silva, A.; Makineni, S. K.; Katnagallu, S.; Stephenson, L.; Freysoldt, C.; Neugebauer, J.; Gault, B.: Chemistry and Structure of Lattice Defects. Physics Colloquium, Faculty of Physics, University Duisburg-Essen, Duisburg, Germany (2019)

Raabe, D.; Ponge, D.; Kwiatkowski da Silva, A.; Katnagallu, S.; Stephenson, L.; Freysoldt, C.; Diehl, M.; Liebscher, C.; Kamachali, R. D.; Zaefferer, S. et al.; Neugebauer, J.; Sandlöbes, S.; Gault, B.; Scheu, C.; Roters, F.: From Atomistic Understanding to Engineering Design of Advanced Medium and High Manganese Steels. 4th International Conference on medium and high Manganese steels, Aachen, Germany (2019)

Raabe, D.; Ponge, D.; Kwiatkowski da Silva, A.; Makineni, S. K.; Katnagallu, S.; Stephenson, L.; Kontis, P.; Wu, X.; Freysoldt, C.; Neugebauer, J. et al.; Gault, B.: Segregation and Transformation at Lattice Defects as Microstructure Design Toolbox. Materials Science and Engineering Congress, Darmstadt, Germany (2018)

Raabe, D.; Ponge, D.; Kwiatkowski da Silva, A.; Herbig, M.; Makineni, S. K.; Wu, X.; Katnagallu, S.; Stephenson, L.; Zhao, H.; Koyama, M. et al.; Kontis, P.; Scheu, C.; Liebscher, C.; Eggeler, G. F.; Spiecker, E.; Gault, B.: Advancing Alloys by Segregation Engineering. 18th International Conference on the Strength of Materials (ICSMA18), Ohio State University, Columbus, OH, USA (2018)

Raabe, D.; Ponge, D.; Kwiatkowski da Silva, A.; Herbig, M.; Makineni, S. K.; Katnagallu, S.; Stephenson, L.; Scheu, C.; Liebscher, C.; Gault, B.: From Seeing Atoms Toward Understanding Atoms: Methods, Results and Challenges of Advanced Atom Probe Tomography. Hausdorff Lecture, Hausdorff Center for Mathematics, University of Bonn, Bonn, Germany (2018)

Mouton, I.; Katnagallu, S.; Schwarz, T.; Makineni, S. K.; Printemps, T.; Grenier, A.; Barnes, J. P.; Cojocaru-Mirédin, O.; Raabe, D.; Gault, B.: Calibration of Atom Probe Tomography Reconstructions from Correlation with Electron Tomograms or Micrographs. APT&M 2018, NIST, Gaithersburg, MD, USA (2018)

Mouton, I.; Katnagallu, S.; Yao, M.; Liebscher, C.; Cojocaru-Mirédin, O.; Schwarz, T.; Makineni, S. K.; Raabe, D.; Gault, B.: Automated calibration of the atom probe tomography reconstructions with electron microscopy images. 7th European Atom Probe Workshop, Gullmarsstrand, Sweden (2017)

Gault, B.; De Geuser, F.; Katnagallu, S.; Nematollahi, G. A.; Dagan, M.; Parviainen, S.; Rusitzka, A. K.; Johnson, E.; Sundell, G.; Andersson, M. et al.; Stephenson, L.; Neugebauer, J.; Moody, M. P.; Vurpillot, F.; Raabe, D.: Reconstructing field ion microscopy and atom probe data. Australian Atom Probe Workshop, Magnetic Island, Australia (2017)

Gault, B.; Dagan, M.; Katnagallu, S.; De Geuser, F.; Vurpillot, F.; Raabe, D.; Moody, M. P.: Revisiting Field Ion Microscopy. TMS 2017, San Diego, CA, USA (2017)