Veröffentlichungen

Suchergebnisse

Buch (1)

  1. 241.
    Buch
    Dehm, G.; Zweck, J.: In-situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science. Wiley VCH Verlag, Weinheim, Germany (2012)

Buchkapitel (7)

  1. 242.
    Buchkapitel
    Kirchlechner, C.; Kečkéš, J.; Micha, J.-S.; Dehm, G.: In Situ μLaue: Instrumental Setup for the Deformation of Micron Sized Samples. In: Neutrons and Synchrotron Radiation in Engineering Materials Science: From Fundamentals to Applications: Second Edition, S. 425 - 438 (Hg. Staron, P.; Schreyer, A.; Clemens, H.; Mayer, S.). wiley, Hoboken, NJ, USA (2017)
  2. 243.
    Buchkapitel
    Dehm, G.; Legros, M.; Kiener, D.: In-situ TEM Straining Experiments: Recent Progress in Stages and Small-Scale Mechanics. In: In-situ Electron Microscopy: SEM and TEM Applications in Physics, Chemistry and Materials Science, S. 227 - 254 (Hg. Dehm, G.). Wiley VCH Verlag, Weinheim, Germany (2012)
  3. 244.
    Buchkapitel
    Dehm, G.: Das Erich-Schmid-Institut für Materialwissenschaft (ESI) der Österreichischen Akademie der Wissenschaften. In: Handbuch der Nanoanalytik Steiermark, NanoNet Styria, 1 Aufl., S. 1 - 311 (Hg. Rom , W.). W. Rom, Graz, Austria (2005)
  4. 245.
    Buchkapitel
    Motz, C.; Kiener, D.; Schöberl, T.; Pippan, R.; Dehm, G.: Sekundärionen-Massenspektroskopie (SIMS) mittels FIB. In: Handbuch der Nanoanalytik Steiermark, NanoNet Styria, 1 Aufl., S. 1 - 311 (Hg. Rom, W.). W. Rom, Graz, Austria (2005)
  5. 246.
    Buchkapitel
    Motz, C.; Kiener, D.; Schöberl, T.; Pippan, R.; Dehm, G.: Fokussierte Ionenstrahl-Technik (FIB) in der Mikro- und Nanomechanik. In: Handbuch der Nanoanalytik Steiermark, NanoNet Styria, 1 Aufl., S. 1 - 311 (Hg. Rom, W.). W. Rom, Graz, Austria (2005)
  6. 247.
    Buchkapitel
    Pippan, R.; Vorhauer, A.; Wetscher, F.; Dehm, G.: Nanokristallisierung durch Hochverformung. In: Handbuch der Nanoanalytik Steiermark, NanoNet Styria, 1 Aufl., S. 1 - 311 (Hg. Rom, W.). W. Rom, Graz, Austria (2005)
  7. 248.
    Buchkapitel
    Dehm, G.; Müllner, P.: TEM-Observation of Dislocations in Polycrystalline Metal Films. In: The Encyclopedia of Materials: Science and Technology, Bd. 1, S. 2329 - 2331 (Hg. Buschow, .H.J.; Cahn, R.; Flemings, M.; Ilschner, .; Kramer, E. et al.) (2001)

Konferenzband (1)

  1. 249.
    Konferenzband
    Microstructure of Ni2B Laser-Induced Surface-Alloyed α-Fe (Materials Resaerch Symposium Proceedings, Phase Transformations and Systems Driven far from Equilibrium, 481). MRS Fall Meeting´97, Boston, MA, USA. (2001)

Konferenzbeitrag (67)

  1. 250.
    Konferenzbeitrag
    Luo, W.; Kirchlechner, C.; Dehm, G.; Stein, F.: Deformation of Micropillars of Cubic and Hexagonal NbCo2 Laves Phases under Uniaxial Compression at Room Temperature. In: Proc. Intermetallics 2017, S. 199 - 200 (Hg. Heilmaier, M.; Krüger, M.; Mayer, S.; Palm, M.; Stein, F.). Intermetallics 2017, Educational Center Kloster Banz, Bad Staffelstein, Germany, 02. Oktober 2017 - 06. Oktober 2017. Conventus Congressmanagement & Marketing GmbH, Jena, Germany (2017)
  2. 251.
    Konferenzbeitrag
    Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Dehm, G.; Scheu, C.: In situ electron microscopy – insights in solid state dewetting of epitaxial Al thin films on sapphire. In: Microscopy Conference 2017 (MC 2017) - Proceedings (Hg. Laue, M.). Microscopy Conference 2017 (MC 2017), Lausanne, Switzerland, 21. August 2017 - 25. August 2017. Universität Regensburg, Regensburg (2017)
  3. 252.
    Konferenzbeitrag
    Taniguchi, S.; Soler, R.; Kirchlechner, C.; Liebscher, C.; Taniyama, A.; Dehm, G.: In-situ TEM Study of Mechanical Size Effects in TiC Strengthened Steels. Microscopy & Microanalysis 2017, St. Louis, MO, USA, 06. August 2017 - 10. August 2017. Proceedings of Microscopy & Microanalysis 2017 23 (S1), S. 732 - 733 (2017)
  4. 253.
    Konferenzbeitrag
    Hieke, S. W.; Dehm, G.; Scheu, C.: Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy. In: European Microscopy Congress 2016: Proceedings. The 16th European Microscopy Congress (EMC 2016), Lyon, France, 28. August 2016 - 02. September 2016. Wiley-VCH Verlag GmbH & Co KGaA (2016)
  5. 254.
    Konferenzbeitrag
    Liebscher, C.; Stoffers, A.; Cojocaru-Mirédin, O.; Gault, B.; Scheu, C.; Dehm, G.; Raabe, D.: Topological Impurity Segregation at Faceted Silicon Grain Boundaries Studied by Correlative Atomic-Resolution STEM and APT. In: Microscopy and Microanalysis, Bd. 22, S. 46 - 47. 3rd Conference on In Situ and Correlative Electron Microscopy (CISCEM 2016) , Saarbrücken, Germany, 11. Oktober 2016 - 12. Oktober 2016. (2016)
  6. 255.
    Konferenzbeitrag
    Heinz, W.; Dehm, G.: Grain resolved orientation changes and texture evolution in a thermally strained Al film on Si substrate. The 38th International Conference on Metallurgical Coatings and Thin Films (ICMCTF 2011), San Diego, CA, USA, 02. Mai 2011 - 06. Mai 2011. Surface and Coatings Technology, Part of special issue: Proceedings of the 38th International Conference on Metallurgical Coatings and Thin Films (ICMCTF), ICMCTF 2011 206 (7), S. 1511 - 2034 (2011)
  7. 256.
    Konferenzbeitrag
    Motz, C.; Kiener, D.; Kirchlechner, C.; Grosinger, W.; Pippan, R.; Dehm, G.: Advances in in-situ testing in scanning electron microscopes: probing mechanical properties at the nano/micro-scale. In: 10th Multinational Congress on Microscopy (MCM 2011), S. 57 - 58. 10th Multinational Congress on Microscopy (MCM 2011). (2011)
  8. 257.
    Konferenzbeitrag
    Cha, L.; Clemens, H. J.; Dehm, G.; Zhang, Z.: In-situ TEM heating study of the γ lamellae formation inside the α2 matrix of a Ti-45Al-7.5Nb alloy. 2010 International Conference on Advances in Materials and Manufacturing Processes, ICAMMP 2010;Code 83174, Shenzhen, China, 06. November 2010 - 08. November 2020. Advanced Materials Research 146-147, S. 1365 - 1368 (2011)
  9. 258.
    Konferenzbeitrag
    Clemens, H. J.; Schmoelzer, T.; Schloffer, M.; Schwaighofer, E.; Mayer, S.; Dehm, G.: Physical metallurgy and properties of β-solidifying TiAl based alloys. In: Materials Research Society symposium proceedings, Bd. 1295, S. 95 - 100. Materials Research Society Symposium N – Intermetallic-Based Alloys for Structural and Functional Applications , San Francisco, CA, USA, 25. April 2011 - 29. April 2011. Materials Research Society: MRS, Leoben, Austria (2011)
  10. 259.
    Konferenzbeitrag
    Dehm, G.; Kiener, D.: Obtaining a quantitative micro- and nano-mechanical understanding of metals using in situ electron microscopy. In: MCM 2011, S. 599 - 600. 10th Multinational Congress on Microscopy (MCM 2011), Urbino, Italy, 04. September 2011 - 09. September 2011. Urbino, Italy (2011)
  11. 260.
    Konferenzbeitrag
    Dehm, G.; Raj, R.; Rühle, M.: Measurement of the Interfacial Shear Strength of Thin Copper Films on Sapphire by Microindentation Experiments. In: Materials Research Symposium Proceedings 1996 (Symposium I – Polycrystalline Thin Films: Structure, Texture, Properties and Applications II), Bd. 403, S. 151 - 156. 1996 MRS Fall Meeting & Exhibit, Boston, MA, USA, 02. Dezember 1996 - 06. Dezember 1996. Materials Research Society, Boston, MA, USA (2011)
 
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