Publikationen von Stefan Werner Hieke

Zeitschriftenartikel (9)

1.
Zeitschriftenartikel
Frank, A.; Dias, M.; Hieke, S. W.; Kruth, A.; Scheu, C.: Spontaneous fluctuations in a plasma ion assisted deposition – correlation between deposition conditions and vanadium oxide thin film growth. Thin Solid Films 722, 138574 (2021)
2.
Zeitschriftenartikel
Frank, A.; Gänsler, T.; Hieke, S. W.; Fleischmann, S.; Husmann, S.; Presser, V.; Scheu, C.: Structural and chemical characterization of MoO2/MoS2 triple-hybrid materials using electron microscopy in up to three dimensions. Nanoscale Advances (3), S. 1067 - 1076 (2021)
3.
Zeitschriftenartikel
Fleischmann, S.; Dörr, T. S.; Frank, A.; Hieke, S. W.; Doblas-Jimenez, D.; Scheu, C.; de Oliveira, P. W.; Kraus, T.; Presser, V.: Gyroidal Niobium Sulfide/Carbon Hybrid Monoliths for Electrochemical Energy Storage. Batteries & Supercaps 2 (8), S. 668 - 672 (2019)
4.
Zeitschriftenartikel
Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Chatain, D.; Dehm, G.; Scheu, C.: On pinning-depinning and microkink-flow in solid state dewetting: Insights by in-situ ESEM on Al thin films. Acta Materialia 165, S. 153 - 163 (2019)
5.
Zeitschriftenartikel
Budak, Ö.; Srimuk, P.; Tolosa, A.; Fleischmann, S.; Lee, J.; Hieke, S. W.; Frank, A.; Scheu, C.; Presser, V.: Vanadium (III) Oxide/Carbon Core/Shell Hybrids as an Anode for Lithium‐Ion Batteries. Batteries & Supercaps 2 (1), S. 74 - 82 (2019)
6.
Zeitschriftenartikel
Hieke, S. W.; Dehm, G.; Scheu, C.: Annealing induced void formation in epitaxial Al thin films on sapphire (α-Al2O3). Acta Materialia 140, S. 355 - 365 (2017)
7.
Zeitschriftenartikel
Toparli, C.; Hieke, S. W.; Altin, A.; Kasian, O.; Scheu, C.; Erbe, A.: State of the Surface of Antibacterial Copper in Phosphate Buffered Saline. Journal of the Electrochemical Society 164 (12), S. H734 - H742 (2017)
8.
Zeitschriftenartikel
Hieke, S. W.; Breitbach, B.; Dehm, G.; Scheu, C.: Microstructural evolution and solid state dewetting of epitaxial Al thin films on sapphire (α-Al2O3). Acta Materialia 133, S. 356 - 366 (2017)
9.
Zeitschriftenartikel
Raghavan, R.; Harzer, T. P.; Djaziri, S.; Hieke, S. W.; Kirchlechner, C.; Dehm, G.: Maintaining strength in supersaturated copper–chromium thin films annealed at 0.5 of the melting temperature of Cu. Journal of Materials Science 52 (2), S. 913 - 920 (2017)

Konferenzbeitrag (2)

10.
Konferenzbeitrag
Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Dehm, G.; Scheu, C.: In situ electron microscopy – insights in solid state dewetting of epitaxial Al thin films on sapphire. In: Microscopy Conference 2017 (MC 2017) - Proceedings (Hg. Laue, M.). Microscopy Conference 2017 (MC 2017), Lausanne, Switzerland, 21. August 2017 - 25. August 2017. Universität Regensburg, Regensburg (2017)
11.
Konferenzbeitrag
Hieke, S. W.; Dehm, G.; Scheu, C.: Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy. In: European Microscopy Congress 2016: Proceedings, S. 203 - 204. The 16th European Microscopy Congress (EMC 2016), Lyon, France, 28. August 2016 - 02. September 2016. Wiley-VCH Verlag GmbH & Co KGaA (2016)

Vortrag (10)

12.
Vortrag
Scheu, C.; Hieke, S. W.: How stable are thin Aluminium films: Dewetting phenomena observed by in-situ electron microscopy. Microscopy Conference 2019 (MC2019), Berlin, Germany (2019)
13.
Vortrag
Scheu, C.; Hieke, S. W.: Fundamentals and Applications of Electron Energy-Loss Spectroscopy in a Scanning Transmission Electron Microscope. Universita' Roma Tre Colloquium, Roma, Italy (2019)
14.
Vortrag
Frank, A.; Dias, M.; Hieke, S. W.; Kruth, A.; Scheu, C.: Electron microscopic investigation of the influence of plasma parameters on VOx films deposited by a plasma ion assisted process. E-MRS 2019 Spring Meeting, Nice, France (2019)
15.
Vortrag
Frank, A.; Hieke, S. W.; Dias, M.; Fleischmann, S.; Presser, V.; Kruth, A.; Scheu, C.: Transmission electron microscopy study of carbon/metal oxide hybrid materials for Energy Storage Application. 19th International Microscopy Congress IMC19, Sydney, Australia (2018)
16.
Vortrag
Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Dehm, G.; Scheu, C.: Evolution of faceted voids and fingering instabilities in a model thin film system - Insights by in-situ environmental scanning electron microscopy. Symposium - In situ Microscopy with Electrons, X‐rays and Scanning Probes, Universität Erlangen‐Nürnberg, Erlangen, Germany (2017)
17.
Vortrag
Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Dehm, G.; Scheu, C.: In-situ electron microscopy: Insights in solid state dewetting of epitaxial Al thin films on sapphire. 13th Multinational Congress on Microscopy, Rovinj, Croatia (2017)
18.
Vortrag
Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Dehm, G.; Scheu, C.: In-situ electron microscopy: Insights in solid state dewetting of epitaxial Al thin films on sapphire. Microscopy Conference 2017 – Dreiländertagung (MC 2017), Lausanne, Switzerland (2017)
19.
Vortrag
Hieke, S. W.; Dehm, G.; Scheu, C.: Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy. The 16th European Microscopy Congress (EMC 2016), Lyon, France (2016)
20.
Vortrag
Hieke, S. W.; Dehm, G.; Scheu, C.: Solid state dewetting of epitaxial Al thin films on sapphire studied by electron microscopy. Materials Research Society Fall Meeting & Exhibition 2016 (MRS Fall 2016), Boston, MA, USA (2016)
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