Publikationen von Martin Rester

Zeitschriftenartikel (5)

Gamsjäger, E.; Liu, Y.; Rester, M.; Puschnig, P.; Draxl, C.; Clemens, H. J.; Dehm, G.; Fischer, F. D.: Diffusive and massive phase transformations in Ti–Al–Nb alloys-Modelling and experiments. Intermetallics 38, S. 126 - 138 (2013)
Yang, B.; Motz, C.; Rester, M.; Dehm, G.: Yield stress influenced by the ratio of wire diameter to grain size – a competition between the effects of specimen microstructure and dimension in micro-sized polycrystalline copper wires. Philosophical Magazine Letters; Nano-mechanical testing in materials research and development III 92 (25-27), S. 3243 - 3256 (2012)
Rester, M.; Fischer, F. D.; Kirchlechner, C.; Schmoelzer, T.; Clemens, H. J.; Dehm, G.: Deformation mechanisms in micron-sized PST TiAl compression samples: Experiment and model. Acta Materialia 59 (9), S. 3410 - 3421 (2011)
Kiener, D.; Rester, M.; Scheriau, S.; Yang, B.; Pippan, R.; Dehm, G.: Influence of external and internal length scale on the flow stress of copper. International Journal of Materials Research 98 (11), S. 1047 - 1053 (2007)
Kiener, D.; Motz, C.; Rester, M.; Jenko, M.; Dehm, G.: FIB damage of Cu and possible consequences for miniaturized mechanical tests. Materials Science and Engineering A: Structural Materials Properties Microstructure and Processing 459 (1-2), S. 262 - 272 (2007)

Konferenzbeitrag (2)

Rester, M.; Cha, L.; Scheu, C.; Dehm, G.; Clemens, H. J.; Kothleitner, G.; Leisch, M.: Microstructure of a massively transformed high Nb containing γ-TiAl based alloy. In: 9th Multinational Microscopy Conference 2009, S. 231 - 232 (Hg. Kothleitner, G.; Leisch, M.). 9th Multinational Microscopy Conference 2009, Graz, Austria, 30. August 2009. Verlag der Technischen Universität Graz, Graz, Austria (2009)
Kiener, D.; Jörg, T.; Rester, M.; Motz, C.; Dehm, G.: Conventional TEM Investigation of the FIB Damage in Copper. In: Proceeding 33rd Microscopy Conference, Deutsche Gesellschaft für Elektronenmikroskopie, S. 100 - 101. 33rd Microscopy Conference, Deutsche Gesellschaft für Elektronenmikroskopie, Saarbrücken, Germany, 02. September 2007 - 07. September 2007. (2007)

Poster (1)

Rester, M.; Kiener, D.; Kreuzer, H. G.M.; Dehm, G.; Motz, C.: Microstructural investigation of the deformation zone below nanoindents in copper, silver and nickel. Hysitron Workshop and Usermeeting, München, Germany (2006)
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