Team

Suchergebnisse

Buchkapitel (7)

  1. 261.
    Buchkapitel
    Dehm, G.: Das Erich-Schmid-Institut für Materialwissenschaft (ESI) der Österreichischen Akademie der Wissenschaften. In: Handbuch der Nanoanalytik Steiermark, NanoNet Styria, 1 Aufl., S. 1 - 311 (Hg. Rom , W.). W. Rom, Graz, Austria (2005)
  2. 262.
    Buchkapitel
    Motz, C.; Kiener, D.; Schöberl, T.; Pippan, R.; Dehm, G.: Sekundärionen-Massenspektroskopie (SIMS) mittels FIB. In: Handbuch der Nanoanalytik Steiermark, NanoNet Styria, 1 Aufl., S. 1 - 311 (Hg. Rom, W.). W. Rom, Graz, Austria (2005)
  3. 263.
    Buchkapitel
    Motz, C.; Kiener, D.; Schöberl, T.; Pippan, R.; Dehm, G.: Fokussierte Ionenstrahl-Technik (FIB) in der Mikro- und Nanomechanik. In: Handbuch der Nanoanalytik Steiermark, NanoNet Styria, 1 Aufl., S. 1 - 311 (Hg. Rom, W.). W. Rom, Graz, Austria (2005)
  4. 264.
    Buchkapitel
    Pippan, R.; Vorhauer, A.; Wetscher, F.; Dehm, G.: Nanokristallisierung durch Hochverformung. In: Handbuch der Nanoanalytik Steiermark, NanoNet Styria, 1 Aufl., S. 1 - 311 (Hg. Rom, W.). W. Rom, Graz, Austria (2005)
  5. 265.
    Buchkapitel
    Dehm, G.; Müllner, P.: TEM-Observation of Dislocations in Polycrystalline Metal Films. In: The Encyclopedia of Materials: Science and Technology, Bd. 1, S. 2329 - 2331 (Hg. Buschow, .H.J.; Cahn, R.; Flemings, M.; Ilschner, .; Kramer, E. et al.) (2001)

Konferenzband (1)

  1. 266.
    Konferenzband
    Microstructure of Ni2B Laser-Induced Surface-Alloyed α-Fe (Materials Resaerch Symposium Proceedings, Phase Transformations and Systems Driven far from Equilibrium, 481). MRS Fall Meeting´97, Boston, MA, USA. (2001)

Konferenzbeitrag (68)

  1. 267.
    Konferenzbeitrag
    Luo, W.; Kirchlechner, C.; Dehm, G.; Stein, F.: Micromechanics of Co–Nb Laves Phases: Strength, Fracture Toughness, and Hadrness as Function of Composition and Crystal Structure. In: Joint EPRI – 123HIMAT International Conference on Advances in High-Temperature Materials, 2019, S. 11 - 21 (Hg. Shingledecker, J.; Takeyama, M.). EPRI's 9th International Conf on Advances in Materials Technology for Fossil Power Plants and the 2nd International 123HiMAT Conf on High-Temperature Materials, Nagasaki, Japan, 21. Oktober 2019 - 24. Oktober 2019. (2019)
  2. 268.
    Konferenzbeitrag
    Luo, W.; Kirchlechner, C.; Dehm, G.; Stein, F.: Deformation of Micropillars of Cubic and Hexagonal NbCo2 Laves Phases under Uniaxial Compression at Room Temperature. In: Proc. Intermetallics 2017, S. 199 - 200 (Hg. Heilmaier, M.; Krüger, M.; Mayer, S.; Palm, M.; Stein, F.). Intermetallics 2017, Educational Center Kloster Banz, Bad Staffelstein, Germany, 02. Oktober 2017 - 06. Oktober 2017. Conventus Congressmanagement & Marketing GmbH, Jena, Germany (2017)
  3. 269.
    Konferenzbeitrag
    Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Dehm, G.; Scheu, C.: In situ electron microscopy – insights in solid state dewetting of epitaxial Al thin films on sapphire. In: Microscopy Conference 2017 (MC 2017) - Proceedings (Hg. Laue, M.). Microscopy Conference 2017 (MC 2017), Lausanne, Switzerland, 21. August 2017 - 25. August 2017. Universität Regensburg, Regensburg (2017)
  4. 270.
    Konferenzbeitrag
    Taniguchi, S.; Soler, R.; Kirchlechner, C.; Liebscher, C.; Taniyama, A.; Dehm, G.: In-situ TEM Study of Mechanical Size Effects in TiC Strengthened Steels. Microscopy & Microanalysis 2017, St. Louis, MO, USA, 06. August 2017 - 10. August 2017. Proceedings of Microscopy & Microanalysis 2017 23 (S1), S. 732 - 733 (2017)
  5. 271.
    Konferenzbeitrag
    Hieke, S. W.; Dehm, G.; Scheu, C.: Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy. In: European Microscopy Congress 2016: Proceedings. The 16th European Microscopy Congress (EMC 2016), Lyon, France, 28. August 2016 - 02. September 2016. Wiley-VCH Verlag GmbH & Co KGaA (2016)
  6. 272.
    Konferenzbeitrag
    Liebscher, C.; Stoffers, A.; Cojocaru-Mirédin, O.; Gault, B.; Scheu, C.; Dehm, G.; Raabe, D.: Topological Impurity Segregation at Faceted Silicon Grain Boundaries Studied by Correlative Atomic-Resolution STEM and APT. In: Microscopy and Microanalysis, Bd. 22, S. 46 - 47. 3rd Conference on In Situ and Correlative Electron Microscopy (CISCEM 2016) , Saarbrücken, Germany, 11. Oktober 2016 - 12. Oktober 2016. (2016)
  7. 273.
    Konferenzbeitrag
    Heinz, W.; Dehm, G.: Grain resolved orientation changes and texture evolution in a thermally strained Al film on Si substrate. The 38th International Conference on Metallurgical Coatings and Thin Films (ICMCTF 2011), San Diego, CA, USA, 02. Mai 2011 - 06. Mai 2011. Surface and Coatings Technology, Part of special issue: Proceedings of the 38th International Conference on Metallurgical Coatings and Thin Films (ICMCTF), ICMCTF 2011 206 (7), S. 1511 - 2034 (2011)
  8. 274.
    Konferenzbeitrag
    Motz, C.; Kiener, D.; Kirchlechner, C.; Grosinger, W.; Pippan, R.; Dehm, G.: Advances in in-situ testing in scanning electron microscopes: probing mechanical properties at the nano/micro-scale. In: 10th Multinational Congress on Microscopy (MCM 2011), S. 57 - 58. 10th Multinational Congress on Microscopy (MCM 2011). (2011)
  9. 275.
    Konferenzbeitrag
    Cha, L.; Clemens, H. J.; Dehm, G.; Zhang, Z.: In-situ TEM heating study of the γ lamellae formation inside the α2 matrix of a Ti-45Al-7.5Nb alloy. 2010 International Conference on Advances in Materials and Manufacturing Processes, ICAMMP 2010;Code 83174, Shenzhen, China, 06. November 2010 - 08. November 2020. Advanced Materials Research 146-147, S. 1365 - 1368 (2011)
  10. 276.
    Konferenzbeitrag
    Clemens, H. J.; Schmoelzer, T.; Schloffer, M.; Schwaighofer, E.; Mayer, S.; Dehm, G.: Physical metallurgy and properties of β-solidifying TiAl based alloys. In: Materials Research Society symposium proceedings, Bd. 1295, S. 95 - 100. Materials Research Society Symposium N – Intermetallic-Based Alloys for Structural and Functional Applications , San Francisco, CA, USA, 25. April 2011 - 29. April 2011. Materials Research Society: MRS, Leoben, Austria (2011)
  11. 277.
    Konferenzbeitrag
    Dehm, G.; Kiener, D.: Obtaining a quantitative micro- and nano-mechanical understanding of metals using in situ electron microscopy. In: MCM 2011, S. 599 - 600. 10th Multinational Congress on Microscopy (MCM 2011), Urbino, Italy, 04. September 2011 - 09. September 2011. Urbino, Italy (2011)
  12. 278.
    Konferenzbeitrag
    Dehm, G.; Raj, R.; Rühle, M.: Measurement of the Interfacial Shear Strength of Thin Copper Films on Sapphire by Microindentation Experiments. In: Materials Research Symposium Proceedings 1996 (Symposium I – Polycrystalline Thin Films: Structure, Texture, Properties and Applications II), Bd. 403, S. 151 - 156. 1996 MRS Fall Meeting & Exhibit, Boston, MA, USA, 02. Dezember 1996 - 06. Dezember 1996. Materials Research Society, Boston, MA, USA (2011)
  13. 279.
    Konferenzbeitrag
    Kiener, D.; Kirchlechner, C.; Zhang, Z.; Ulrich, O.; Micha, J.-S.; Dehm, G.: Plasticity of FIB fabricated micro-samples investigated by in-situ micro-Laue diffraction and in-situ TEM. In: 10th Multinational Congress on Microscopy (MCM 2011), S. 129 - 130. 10th Multinational Congress on Microscopy (MCM 2011), Urbino, Italy , 04. September 2011 - 09. September 2011. (2011)
  14. 280.
    Konferenzbeitrag
    Huang, R.; Robl, W.; Dehm, G.; Ceric, H.; Detzel, T.: Disparate tendency of stress evolution of thin and thick electroplated Cu films at room temperature. In: Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, 5532222, S. 1 - 6. International Symposium on the Physical and Failure Analysis of Integrated Circuits IPFA 2010, Singapore, Singapore, 05. Juli 2010 - 09. Juli 2010. IEEE (2010)
 
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