Publikationen von Frédéric De Geuser

Gault, B.; Dagan, M.; Katnagallu, S.; De Geuser, F.; Vurpillot, F.; Raabe, D.; Moody, M. P.: Revisiting Field Ion Microscopy. TMS 2017, San Diego, CA, USA (2017)

Gault, B.; De Geuser, F.: A perspective on the ion projection in field ion & atom probe microscopy. Atom Probe Tomography & Microscopy 2016, Gyeongju, South Korea (2016)