Publikationen von Se-Ho Kim

Gault, B.; Schweinar, K.; Zhang, S.; Lahn, L.; Scheu, C.; Kim, S.-H.; Kasian, O.: Correlating atom probe tomography with x-ray and electron spectroscopies to understand microstructure-activity relationships in electrocatalysts. MRS Bulletin 47, S. 718 - 726 (2022)

Khanchandani, H.; El-Zoka, A.; Kim, S.-H.; Tezins, U.; Vogel, D.; Sturm, A.; Raabe, D.; Gault, B.; Stephenson, L.: Laser-equipped gas reaction chamber for probing environmentally sensitive materials at near atomic scale. PLoS One 17 (2), e0262543 (2022)

Kim, S.-H.; Yoo, S.-H.; Shin, S.; El-Zoka, A.; Kasian, O.; Lim, J.; Jeong, J.; Scheu, C.; Neugebauer, J.; Lee, H. et al.; Todorova, M.; Gault, B.: Controlled Doping of Electrocatalysts through Engineering Impurities. Advanced Materials, 2203030 (2022)

Zhang, S.; Ahmet, I.; Kim, S.-H.; Kasian, O.; Mingers, A. M.; Schnell, P.; Kölbach, M.; Lim, J.; Fischer, A.; Mayrhofer, K. J. J. et al.; Cherevko, S.; Gault, B.; van de Krol, R.; Scheu, C.: Different Photostability of BiVO₄ in Near-pH-Neutral Electrolytes. ACS Applied Energy Materials 3 (10), S. 9523 - 9527 (2020)

Lim, J.; Kim, S.-H.; Aymerich Armengol, R.; Kasian, O.; Choi, P.-P.; Stephenson, L.; Gault, B.; Scheu, C.: Atomic‐Scale Mapping of Impurities in Partially Reduced Hollow TiO₂ Nanowires. Angewandte Chemie, International Edition in English 59 (14), S. 5651 - 5655 (2020)

Kim, S.-H.; Lim, J.; Sahu, R.; Kasian, O.; Stephenson, L.; Scheu, C.; Gault, B.: Direct Imaging of Dopant and Impurity Distributions in 2D MoS₂. Advanced Materials 32 (8), 1907235 (2020)