Publikationen von Sebastian Send

Abboud, A.; Kirchlechner, C.; Kečkéš, J.; Çonka-Nurdan, T.; Send, S.; Micha, J.-S.; Ulrich, O.; Hartmann, R.; Strüderf, L.; Pietsch, U.: Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a twodimensional energy-dispersive detector. Journal of Applied Crystallography 50 (3), S. 901 - 908 (2017)

Abboud, A.; Kirchlechner, C.; Send, S.; Micha, J.-S.; Ulrich, O.; Pashniak, N.; Strüder, L. W.; Kečkéš, J.; Pietsch, U.: A new method for polychromatic X-ray μLaue diffraction on a Cu pillar using an energy-dispersive pn-junction charge-coupled device. Review of Scientific Instruments 85 (11), 113901 (2014)