Publikationen von Gerhard Dehm
Alle Typen
Konferenzbeitrag (71)
381.
Konferenzbeitrag
3, S. 69 - 70 (Hg. Kothleitner, G.; Leisch, M.). 9th Multinational Microscopy Conference 2009, Graz, Austria, 30. August 2009 - 04. September 2009. Verlag der Technischen Universität Graz, Graz, Austria (2009)
A structural characterization of a Cu/MgO (001) interface using Cs corrected TEM. In: 9th Multinational Microscopy Conference 2009, Materials Science, Bd. 382.
Konferenzbeitrag
Kothleitner, G.). 9th Multinational Microscopy Conference 2009, Graz, Austria, 30. August 2009 - 04. September 2009. Verlag der Technischen Universität Graz, Graz, Austria (2009)
A structural characterization of a Cu/MgO (001) interface using Cs corrected HRTEM. In: 9th Multinational Microscopy Conference 2009 (Hg. 383.
Konferenzbeitrag
3, S. 247 - 248 (Hg. Kothleitner, G.; Leisch, M.). 9th Multinational Microscopy Conference 2009, Graz, Austria, 30. August 2009 - 04. September 2009. Verlag der Technischen Universität Graz, Graz, Austria (2009)
A TEM study of ultra-fine lamellar structures in titanium aluminide. In: 9th Multinational Microscopy Conference 2009 Materials Science, Bd. 384.
Konferenzbeitrag
1128, S. 153 - 158. MRS Fall Meeting 2009, Boston, MA, USA, 30. November 2009 - 04. Dezember 2009. (2009)
Initial stages of lamellae formation in high Nb containing γ-TiAl based alloys. In: Materials Research Society Symposium Proceedings 2009, Bd. 385.
Konferenzbeitrag
Kothleitner, G.; Leisch, M.). 9th Multinational Microscopy Conference 2009, Graz, Austria, 30. August 2009 - 04. September 2009. Verlag der Technischen Universität Graz, Graz, Austria (2009)
Determination of micro-mechanical properties: In-situ compression, tension and fracture testing within the SEM. In: 9th Multinational Microscopy Conference 2009, S. 501 - 502 (Hg. 386.
Konferenzbeitrag
1, S. 249 - 250. 9th Multinational Microscopy Conference 2009, Institute for Electron Microscopy Graz, University of Technology , Graz, Austria, 30. August 2009. Verlag der Technischen Universität Graz, Graz, Austria (2009)
A Novel Preparation Route to Obtain Micro-Bending Beams for In-situ TEM Studies. In: Instrumentation and Methodology, Bd. 387.
Konferenzbeitrag
Kothleitner, G.). 9th Multinational Microscopy Conference 2009, Graz, Austria, 30. August 2009 - 04. September 2008. Verlag der Technischen Universität Graz, Graz, Austria (2009)
EELS Measurements and Ab-initio Calculations of the N–K Edge in TiN/VN Films Deposited on MgO Substrates. In: 9th Multinational Microscopy Conference 2009, S. 285 - 286 (Hg. 388.
Konferenzbeitrag
Kothleitner, G.; Leisch, M.). 9th Multinational Microscopy Conference 2009, Graz, Austria, 30. August 2009. Verlag der Technischen Universität Graz, Graz, Austria (2009)
Microstructure of a massively transformed high Nb containing γ-TiAl based alloy. In: 9th Multinational Microscopy Conference 2009, S. 231 - 232 (Hg. 389.
Konferenzbeitrag
Kothleitner, G.; Leisch, M.). 9th Multinational Microscopy Conference 2009, Graz, Austria, 30. August 2009 - 04. September 2009. (2009)
Atomic and electronic structural studies of VN/MgO (001) interface by an image-side Cs-corrected electron microscope. In: 9th Multinational Microscopy Conference 2009, S. 15 - 16 (Hg. 390.
Konferenzbeitrag
Conventional TEM Investigation of the FIB Damage in Copper. In: Proceeding 33rd Microscopy Conference, Deutsche Gesellschaft für Elektronenmikroskopie, S. 100 - 101. 33rd Microscopy Conference, Deutsche Gesellschaft für Elektronenmikroskopie, Saarbrücken, Germany, 02. September 2007 - 07. September 2007. (2007)
391.
Konferenzbeitrag
Size-Induced Transition from Perfect to Partial Dislocation Plasticity in Single Crystal Au Films on Polyimide. In: Proceeding Microscopy 33rd Conference, Deutsche Gesellschaft für Elektronenmikroskopie, S. 278 - 279. Microscopy 33rd Conference, Deutsche Gesellschaft für Elektronenmikroskopie, Saarbrücken, Germany, 02. September 2007 - 07. September 2007. (2007)
392.
Konferenzbeitrag
A Comparison of the Electronic Structure of N–K in TiN and VN using EELS and Ab-initio Calculations. In: Proceeding 33rd Microscopy Conference, Deutsche Gesellschaft für Elektronenmikroskopie, S. 414 - 415. Microscopy 33rd Conference, Deutsche Gesellschaft für Elektronenmikroskopie, Saarbrücken, Germany, 02. September 2007 - 07. September 2007. (2007)
393.
Konferenzbeitrag
41 (14), S. 4484 - 4489 (2006)
In-situ TEM straining experiments of Al films on polyimide using a novel FIB design for specimen preparation. 10th Meeting on Frontiers of Electron Microscopy in Materials Science, Maastricht, The Netherlands, 25. September 2005 - 30. September 2005. Journal of Materials Science 394.
Konferenzbeitrag
In-situ TEM tensile testing of thin Au films: A transition in deformation mechanism. Meeting at Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Leoben, Austria., (2006)
395.
Konferenzbeitrag
817, S. 192 - 197 (2006)
Strain energy effects on texture evolution in thin films: Biaxial vs. uniaxial stress state. 8th International Workshop on Stress-Induced Phenomena in Metallization; Code 68627, Dresden; Germany, 12. September 2005 - 14. September 2005. AIP Conference Proceedings 396.
Konferenzbeitrag
817, S. 185 - 191 (2006)
Passivation Effects in Copper Thin Films. 8th International Workshop on Stress-Induced Phenomena in Metallization, Dresden; Germany, 12. September 2005 - 14. September 2005. AIP Conference Proceedings 397.
Konferenzbeitrag
817, S. 98 - 103. 8th International Workshop on Stress-Induced Phenomena in Metallization; Code 68627, Dresden; Germany, 12. September 2005 - 14. September 2005. (2006)
Thermomechanical behavior of thin metal films under different ambient conditions. In: AIP Conference Proceedings, Bd. 398.
Konferenzbeitrag
In-Situ compression tests on micron-sized copper pillars. Meeting at Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Leoben, Austria, 29. Januar 2006., (2006)
399.
Konferenzbeitrag
875. 2005 MRS Spring Meeting. (2005)
In-Situ TEM Study of Plastic Stress Relaxation Mechanisms and Interface Effects in Metallic Films. In: MRS Proceedings, Bd. 400.
Konferenzbeitrag
1, S. 489 - 503. 16th International Plansee Seminar 2005, Reutte, Austria, 30. Mai 2005 - 03. Juni 2005. (2005)
Microstructure and Mechanical Properties of Si and Y Doped Tantalum. In: Proceedings of the 16th International Plansee Seminar 2005, Bd.