Vortrag
Schwarz, T.; Stechmann, G.; Gault, B.; Cojocaru-Mirédin, O.; Würz, R.; Lomuscio, A.; Siebentritt, S.; Raabe, D.: Correlative transmission Kikuchi diffraction and atom probe tomography analysis of grain boundaries in Cu(In,Ga) Se
2 and CuInS
2 in thin film solar cells. APT&M 2018, NIST, Gaithersburg, MD, USA (2018)