Konferenzbeitrag
Folger, A.; Wisnet, A.; Scheu, C.: Defects in as-grown vs. annealed rutile titania nanowires and their effect on properties. EMC 2016, 16th European Microscopy Congress, Lyon, France, 28. August 2016 - 02. September 2016. European Microscopy Congress 2016: Proceedings, S. 409 - 410 (2016)