Konferenzbeitrag
Peng, Z.; Gault, B.; Raabe, D.; Ashton, M. W.; Sinnott, S. B.; Choi, P.-P.; Li, Y.: On the Multiple Event Detection in Atom Probe Tomography. In: MicroscopyMicroanalysis, Bd.
23, S. 618 - 619. Microscopy & Microanalysis 2017, St. Louis, MO, USA, 06. August 2017 - 10. August 2017. (2017)