Publikationen von Winfried Seifert

Stoffers, A.; Cojocaru-Mirédin, O.; Seifert, W.; Zaefferer, S.; Riepe, S.; Raabe, D.: Grain boundary segregation in multicrystalline silicon: correlative characterization by EBSD, EBIC, and atom probe tomography. Progress in Photovoltaics: Research and Applications 23 (12), S. 1742 - 1753 (2015)

Stoffers, A.; Cojocaru-Mirédin, O.; Breitenstein, O.; Seifert, W.; Zaefferer, S.; Raabe, D.: Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography. In: 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014, 6925089, S. 42 - 46. 40th IEEE Photovoltaic Specialist Conference, PVSC 2014, Denver, CO, USA, 08. Juni 2014 - 13. Juni 2014. (2014)

Stoffers, A.; Cojocaru-Mirédin, O.; Breitenstein, O.; Seifert, W.; Zaefferer, S.; Raabe, D.: Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography. 40th IEEE Photovoltaic Specialists Conference, Denver, CO, USA (2014)

Stoffers, A.; Cojocaru-Mirédin, O.; Seifert, W.; Zaefferer, S.; Raabe, D.: A correlative EBSD, EBIC and APT study of grain boundary segregation in multicrystalline silicon. Atom Probe Tomography & Microscopy 2014, Stuttgart, Germany (2014)

Stoffers, A.; Cojocaru-Mirédin, O.; Breitenstein, O.; Seifert, W.; Raabe, D.: Recombination activity at the atomic scale: Correlative analysis of grain boundaries in multicrystalline silicon solar cells. Euromat 2013, Sevilla, Spain (2013)