Publikationen von Daniel Gall

Cazottes, S.; Zhang, Z.; Daniel, R.; Chawla, J. S.; Gall, D.; Dehm, G.: Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM. Thin Solid Films 519 (5), S. 1662 - 1667 (2010)

Dehm, G.; Wörgötter, H. P.; Cazottes, S.; Purswani, J. M.; Gall, D.; Mitterer, C.; Kiener, D.: Can micro-compression testing provide stress–strain data for thin films? A comparative study using Cu, VN, TiN and W coatings. Thin Solid Films 518 (5), S. 1517 - 1521 (2009)

Wörgötter, H.-P.; Kiener, D.; Purswani, J. M.; Gall, D.; Dehm, G.: Testing thin films by microcompression: Benefits and limits. BHM Berg- und Hüttenmännische Monatshefte 153 (7), S. 257 - 262 (2008)