Publikationen von Niels Cautaerts

Gopalan, H.; Marshal, A.; Hans, M.; Primetzhofer, D.; Cautaerts, N.; Breitbach, B.; Völker, B.; Kirchlechner, C.; Schneider, J. M.; Dehm, G.: On the interplay between microstructure, residual stress and fracture toughness of (Hf–Nb–Ta–Zr)C multi-metal carbide hard coatings. Materials and Design 224, 111323 (2022)

Cautaerts, N.; Crout, P.; Ånes, H. W.; Prestat, E.; Jeong, J.; Dehm, G.; Liebscher, C.: Free, flexible and fast: Orientation mapping using the multi-core and GPU-accelerated template matching capabilities in the Python-based open source 4D-STEM analysis toolbox Pyxem. Ultramicroscopy 237, 113517 (2022)

Zhang, S.; Xie, Z.; Keuter, P.; Ahmad, S.; Abdellaoui, L.; Zhou, X.; Cautaerts, N.; Breitbach, B.; Aliramaji, S.; Korte-Kerzel, S. et al.; Hans, M.; Schneider, J. M.; Scheu, C.: Atomistic structures of〈0001〉tilt grain boundaries in a textured Mg thin film. Nanoscale 14 (48), S. 18192 - 18199 (2022)

Jeong, J.; Cautaerts, N.; Dehm, G.; Liebscher, C.: Automated Crystal Orientation Mapping by Precession Electron Diffraction-Assisted Four-Dimensional Scanning Transmission Electron Microscopy Using a Scintillator-Based CMOS Detector. Microscopy and Microanalysis 27 (5), S. 1102 - 1112 (2021)

Cautaerts, N.; Rauch, E. F.; Jeong, J.; Dehm, G.; Liebscher, C.: Investigation of the orientation relationship between nano-sized G-phase precipitates and austenite with scanning nano-beam electron diffraction using a pixelated detector. Scripta Materialia 201, 113930 (2021)