Publikationen von Otwin Breitenstein
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Konferenzbeitrag (1)
1.
Konferenzbeitrag
Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography. In: 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014, 6925089, S. 42 - 46. 40th IEEE Photovoltaic Specialist Conference, PVSC 2014, Denver, CO, USA, 08. Juni 2014 - 13. Juni 2014. (2014)
Vortrag (2)
2.
Vortrag
Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography. 40th IEEE Photovoltaic Specialists Conference, Denver, CO, USA (2014)
3.
Vortrag
Recombination activity at the atomic scale: Correlative analysis of grain boundaries in multicrystalline silicon solar cells. Euromat 2013, Sevilla, Spain (2013)